Inventor · disambiguated record
Vadim Vereschagin
Also filed as: VERESCHAGIN VADIM
8 granted patents·1 pending application·3 citations·filing 2018–2024
75Inventor score
Top patents by PatentIndex Score
9 records- 0176US11276160B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 15, 2022·2 cites·17 claims
- 0269US11756188B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Sep 12, 2023·0 cites·14 claims
- 0369US10810722B2System, method and computer program product for analyzing JPEG images for forensic and other purposesAU10TIX LTD·Filed 2018·Granted Oct 20, 2020·1 cites·20 claims
- 0461US11315230B2System, method and computer program product for analyzing jpeg images for forensic and other purposesAU10TIX LTD·Filed 2020·Granted Apr 26, 2022·0 cites·23 claims
- 0556US2025232424A1Determination of undercut sidewalls based on an image of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0652US12347734B2Examination of a hole formed in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Jul 1, 2025·0 cites·21 claims
- 0747US11686571B2Local shape deviation in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Jun 27, 2023·0 cites·20 claims
- 0844US11651509B2Method, system and computer program product for 3D-NAND CDSEM metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted May 16, 2023·0 cites·11 claims
- 0944US11476081B2Evaluating an intermediate product related to a three-dimensional NAND memory unitAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Oct 18, 2022·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →