Inventor · disambiguated record
Vinay Agrawal
Also filed as: AGRAWAL VINAY
4 granted patents·1 pending application·40 citations·filing 2007–2021
76Inventor score
Top patents by PatentIndex Score
5 records- 0194US11599514B1Transactional version setsAMAZON TECH INC·Filed 2021·Granted Mar 7, 2023·19 cites·19 claims
- 0285US7940066B2BIST DDR memory interface circuit and method for testing the sameTEXAS INSTRUMENTS INC·Filed 2010·Granted May 10, 2011·10 cites·7 claims
- 0378US8035407B2Bist DDR memory interface circuit and method for testing the sameTEXAS INSTRUMENTS INC·Filed 2011·Granted Oct 11, 2011·6 cites·5 claims
- 0465US7834615B2Bist DDR memory interface circuit and method for self-testing the same using phase relationship between a data signal and a data strobe signalTEXAS INSTRUMENTS INC·Filed 2007·Granted Nov 16, 2010·5 cites·6 claims
- 0534US2009013228A1Bist ddr memory interface circuit and method for testing the sameJARBOE JR JAMES MICHAEL·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →