Inventor · disambiguated record
Vishal Diwan
Also filed as: DIWAN VISHAL
3 granted patents·6 citations·filing 2019–2022
61Inventor score
Technology areasG01R
Files withTEXAS INSTRUMENTS INC3
Top patents by PatentIndex Score
3 records- 0189US10852353B1Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interfaceTEXAS INSTRUMENTS INC·Filed 2019·Granted Dec 1, 2020·4 cites·22 claims
- 0288US11402432B2Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interfaceTEXAS INSTRUMENTS INC·Filed 2020·Granted Aug 2, 2022·2 cites·10 claims
- 0375US11747399B2Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interfaceTEXAS INSTRUMENTS INC·Filed 2022·Granted Sep 5, 2023·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →