Inventor · disambiguated record
Vincent Huard
Also filed as: HUARD VINCENT
9 granted patents·3 pending applications·18 citations·filing 2006–2019
81Inventor score
Files withST MICROELECTRONICS SA4ST MICROELECTRONICS CROLLES 2 SAS3CHEVALLIER REMY1DENAIS MICKAEL1DOLPHIN DESIGN1
Top patents by PatentIndex Score
12 records- 0190US10302693B2Method for estimating an operating profile of an integrated circuit of a system-on-a-chip, and corresponding system-on-a-chipST MICROELECTRONICS CROLLES 2 SAS·Filed 2017·Granted May 28, 2019·4 cites·22 claims
- 0287US10585143B2Flip flop of a digital electronic chipST MICROELECTRONICS SA·Filed 2018·Granted Mar 10, 2020·4 cites·20 claims
- 0373US7498863B2Compensation for electric drifts of MOS transistorsST MICROELECTRONICS CROLLES 2·Filed 2006·Granted Mar 3, 2009·9 cites·21 claims
- 0465US10634715B2Method for estimating an operating profile of an integrated circuit of a system-on-a-chip, and corresponding system-on-a-chipST MICROELECTRONICS CROLLES 2 SAS·Filed 2019·Granted Apr 28, 2020·0 cites·22 claims
- 0547US8022741B2Digital electronic device and method of altering clock delays in a digital electronic deviceNXP BV·Filed 2008·Granted Sep 20, 2011·1 cites·9 claims
- 0646US10050037B2Method and circuit for integrated circuit body biasingST MICROELECTRONICS SA·Filed 2017·Granted Aug 14, 2018·0 cites·20 claims
- 0745US2018323196A1Method and circuit for integrated circuit body biasingST MICROELECTRONICS SA·Filed 2018·Application pending·0 cites
- 0843US11068630B2Synchronous device with slack guard circuitDOLPHIN DESIGN·Filed 2019·Granted Jul 20, 2021·0 cites·15 claims
- 0941US10514749B2Method for adjusting at least one operating point of at least one integrated circuit of a system on a chip, and corresponding system on a chipST MICROELECTRONICS CROLLES 2 SAS·Filed 2017·Granted Dec 24, 2019·0 cites·33 claims
- 1041US2015142410A1Heterojunction bipolar transistor reliability simulation methodST MICROELECTRONICS SA·Filed 2014·Application pending·0 cites
- 1135USRE44922ECompensation for electric drifts of MOS transistorsDENAIS MICKAEL·Filed 2011·Granted Jun 3, 2014·0 cites·27 claims
- 1222US2012062268A1Method and device for measuring the reliability of an integrated circuitCHEVALLIER REMY·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →