Inventor · disambiguated record
Vishal Sarin
Also filed as: SARIN VISHAL
174 granted patents·7 pending applications·1,560 citations·filing 1997–2025
99Inventor score
Files withMICRON TECHNOLOGY INC79SARIN VISHAL43SILICON STORAGE TECH INC23ROOHPARVAR FRANKIE F15MOSCHIANO VIOLANTE4
Top patents by PatentIndex Score
181 records- 0198US8281061B2Data conditioning to improve flash memory reliabilityRADKE WILLIAM H·Filed 2008·Granted Oct 2, 2012·72 cites·25 claims
- 0298US7639532B2Non-equal threshold voltage ranges in MLC NANDMICRON TECHNOLOGY INC·Filed 2007·Granted Dec 29, 2009·94 cites·17 claims
- 0398US7633798B2M+N bit programming and M+L bit read for M bit memory cellsMICRON TECHNOLOGY INC·Filed 2007·Granted Dec 15, 2009·77 cites·25 claims
- 0497US9158612B2Refresh of non-volatile memory cells based on fatigue conditionsMICRON TECHNOLOGY INC·Filed 2013·Granted Oct 13, 2015·31 cites·21 claims
- 0597US7460398B1Programming a memory with varying bits per cellMICRON TECHNOLOGY INC·Filed 2007·Granted Dec 2, 2008·42 cites·20 claims
- 0696US9875799B1Methods for pattern matching using multiple cell pairsMICRON TECHNOLOGY INC·Filed 2016·Granted Jan 23, 2018·17 cites·25 claims
- 0796US8707112B2Refresh of non-volatile memory cells based on fatigue conditionsROOHPARVAR FRANKIE F·Filed 2011·Granted Apr 22, 2014·27 cites·19 claims
- 0896US8060798B2Refresh of non-volatile memory cells based on fatigue conditionsROOHPARVAR FRANKIE F·Filed 2007·Granted Nov 15, 2011·37 cites·22 claims
- 0996US7782674B2Sensing of memory cells in NAND flashMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 24, 2010·43 cites·23 claims
- 1096US7619933B2Reducing effects of program disturb in a memory deviceMICRON TECHNOLOGY INC·Filed 2007·Granted Nov 17, 2009·47 cites·16 claims
- 1195US8006166B2Programming error correction code into a solid state memory device with varying bits per cellMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 23, 2011·30 cites·20 claims
- 1295US7843725B2M+L bit read column architecture for M bit memory cellsMICRON TECHNOLOGY INC·Filed 2008·Granted Nov 30, 2010·33 cites·25 claims
- 1394US9030870B2Threshold voltage compensation in a multilevel memoryMOSCHIANO VIOLANTE·Filed 2011·Granted May 12, 2015·15 cites·38 claims
- 1494US8254180B2Methods of operating memories including characterizing memory cell signal linesHOEI JUNG-SHENG·Filed 2011·Granted Aug 28, 2012·20 cites·26 claims
- 1593US8031529B2Memory cell threshold voltage drift estimation methods and apparatusMICRON TECHNOLOGY INC·Filed 2010·Granted Oct 4, 2011·17 cites·26 claims
- 1693US7751245B2Programming sequence in NAND memoryMICRON TECHNOLOGY INC·Filed 2007·Granted Jul 6, 2010·23 cites·22 claims
- 1792US10141055B2Methods and apparatus for pattern matching using redundant memory elementsMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 27, 2018·7 cites·9 claims
- 1892US8023334B2Program window adjust for memory cell signal line delayMICRON TECHNOLOGY INC·Filed 2008·Granted Sep 20, 2011·23 cites·20 claims
- 1992US7751253B2Analog sensing of memory cells with a source follower driver in a semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 2008·Granted Jul 6, 2010·20 cites·18 claims
- 2091US8674749B2Fast start charge pump for voltage regulatorsTRAN HIEU VAN·Filed 2010·Granted Mar 18, 2014·11 cites·9 claims
- 2191US8400826B2Coarse and fine programming in a solid state memoryROOHPARVAR FRANKIE F·Filed 2012·Granted Mar 19, 2013·10 cites·20 claims
- 2291US7995400B2Reducing effects of program disturb in a memory deviceMICRON TECHNOLOGY INC·Filed 2009·Granted Aug 9, 2011·20 cites·17 claims
- 2391US7916536B2Programming based on controller performance requirementsMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 29, 2011·19 cites·23 claims
- 2491US7830718B2Mitigation of data corruption from back pattern and program disturb in a non-volatile memory deviceMICRON TECHNOLOGY INC·Filed 2007·Granted Nov 9, 2010·19 cites·25 claims
- 2591US7817467B2Memory controller self-calibration for removing systemic influenceMICRON TECHNOLOGY INC·Filed 2007·Granted Oct 19, 2010·17 cites·27 claims
- 2691US7787307B2Memory cell shift estimation method and apparatusMICRON TECHNOLOGY INC·Filed 2008·Granted Aug 31, 2010·20 cites·43 claims
- 2791US7577036B2Non-volatile multilevel memory cells with data read of reference cellsMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 18, 2009·20 cites·30 claims
- 2890US8719665B2Programming error correction code into a solid state memory device with varying bits per cellMICRON TECHNOLOGY INC·Filed 2013·Granted May 6, 2014·8 cites·22 claims
- 2990US8578244B2Programming error correction code into a solid state memory device with varying bits per cellMICRON TECHNOLOGY INC·Filed 2012·Granted Nov 5, 2013·9 cites·20 claims
- 3090US7768832B2Analog read and write paths in a solid state memory deviceMICRON TECHNOLOGY INC·Filed 2008·Granted Aug 3, 2010·17 cites·22 claims
- 3190US7336516B2Unified multilevel memory systems and methodsSILICON STORAGE TECH INC·Filed 2005·Granted Feb 26, 2008·20 cites·39 claims
- 3289US8355283B2Sensing of memory cells in NAND flashMICRON TECHNOLOGY INC·Filed 2011·Granted Jan 15, 2013·9 cites·25 claims
- 3389US8111550B2M+N bit programming and M+L bit read for M bit memory cellsSARIN VISHAL·Filed 2011·Granted Feb 7, 2012·9 cites·41 claims
- 3489US8072812B2Sensing of memory cells in NAND flashROOHPARVAR FRANKIE F·Filed 2010·Granted Dec 6, 2011·10 cites·20 claims
- 3589US7936599B2Coarse and fine programming in a solid state memoryMICRON TECHNOLOGY INC·Filed 2007·Granted May 3, 2011·14 cites·15 claims
- 3689US7898885B2Analog sensing of memory cells in a solid state memory deviceMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 1, 2011·18 cites·17 claims
- 3789US7868604B2Fast voltage regulators for charge pumpsSILICON STORAGE TECH INC·Filed 2007·Granted Jan 11, 2011·15 cites·26 claims
- 3888US8103940B2Programming error correction code into a solid state memory device with varying bits per cellROOHPARVAR FRANKIE F·Filed 2011·Granted Jan 24, 2012·7 cites·15 claims
- 3988US5798967ASensing scheme for non-volatile memoriesPROGRAMMABLE MICROELECTRONICS·Filed 1997·Granted Aug 25, 1998·76 cites·19 claims
- 4087US8687430B2Analog sensing of memory cells with a source follower driver in a semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 2013·Granted Apr 1, 2014·7 cites·23 claims
- 4187US8107296B2Mitigation of data corruption from back pattern and program disturb in a non-volatile memory deviceSARIN VISHAL·Filed 2010·Granted Jan 31, 2012·8 cites·20 claims
- 4286US8213233B2Reduction of quick charge loss effect in a memory deviceSARIN VISHAL·Filed 2011·Granted Jul 3, 2012·8 cites·18 claims
- 4385US8355278B2Reducing effects of program disturb in a memory deviceMICRON TECHNOLOGY INC·Filed 2010·Granted Jan 15, 2013·8 cites·29 claims
- 4485US8274823B2Methods and apparatus utilizing expected coupling effect in the programming of memory cellsROOHPARVAR FRANKIE F·Filed 2010·Granted Sep 25, 2012·8 cites·20 claims
- 4584US9087594B2Memory apparatus, systems, and methodsMOSCHIANO VIOLANTE·Filed 2012·Granted Jul 21, 2015·6 cites·26 claims
- 4684US8085596B2Reducing noise in semiconductor devicesSARIN VISHAL·Filed 2007·Granted Dec 27, 2011·11 cites·18 claims
- 4784US7864589B2Mitigation of runaway programming of a memory deviceMICRON TECHNOLOGY INC·Filed 2008·Granted Jan 4, 2011·12 cites·22 claims
- 4884US7737765B2Fast start charge pump for voltage regulatorsSILICON STORAGE TECH INC·Filed 2005·Granted Jun 15, 2010·18 cites·24 claims
- 4983US8441858B2Apparatus having a string of memory cellsSARIN VISHAL·Filed 2011·Granted May 14, 2013·6 cites·19 claims
- 5083US8385121B2Memory adapted to program a number of bits to a memory cell and read a different number of bits from the memory cellMICRON TECHNOLOGY INC·Filed 2010·Granted Feb 26, 2013·6 cites·35 claims
Showing the top 50 of 181 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →