Inventor · disambiguated record
Vladimir A. Zilberstein
Also filed as: ZILBERSTEIN VLADIMIR A
23 granted patents·9 pending applications·608 citations·filing 1995–2015
97Inventor score
Top patents by PatentIndex Score
32 records- 0197US6657429B1Material condition assessment with spatially periodic field sensorsJENTEK SENSORS INC·Filed 2000·Granted Dec 2, 2003·116 cites·26 claims
- 0295US6995557B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2004·Granted Feb 7, 2006·64 cites·25 claims
- 0395US6952095B1Surface mounted and scanning spatially periodic eddy-current sensor arraysJENTEK SENSORS INC·Filed 2000·Granted Oct 4, 2005·61 cites·58 claims
- 0495US6727691B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2002·Granted Apr 27, 2004·67 cites·44 claims
- 0594US7451657B2Material condition monitoring with multiple sensing modesJENTEK SENSORS INC·Filed 2005·Granted Nov 18, 2008·29 cites·21 claims
- 0694US7230421B2Damage standard fabrication with attached sensorJENTEK SENSORS INC·Filed 2005·Granted Jun 12, 2007·26 cites·17 claims
- 0793US8237433B2Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2011·Granted Aug 7, 2012·9 cites·35 claims
- 0892US7348771B2Method for verifying sensor conditionJENTEK SENSORS INC·Filed 2006·Granted Mar 25, 2008·16 cites·20 claims
- 0989US7876094B2Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2008·Granted Jan 25, 2011·9 cites·18 claims
- 1087US7696748B2Absolute property measurements using electromagnetic sensorsJENTEK SENSORS INC·Filed 2004·Granted Apr 13, 2010·31 cites·18 claims
- 1186US8494810B2Component adaptive life managementGOLDFINE NEIL J·Filed 2010·Granted Jul 23, 2013·20 cites·23 claims
- 1286US7518360B2Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2007·Granted Apr 14, 2009·11 cites·30 claims
- 1385US7280940B2Segmented field dielectric sensor array for material characterizationJENTEK SENSORS INC·Filed 2006·Granted Oct 9, 2007·9 cites·28 claims
- 1484US7188532B2Self-monitoring metals, alloys and materialsJENTEK SENSORS INC·Filed 2004·Granted Mar 13, 2007·20 cites·13 claims
- 1583US7106055B2Fabrication of samples having predetermined material conditionsJENTEK SENSORS INC·Filed 2004·Granted Sep 12, 2006·20 cites·40 claims
- 1680US7161351B2Hidden feature characterization using a database of sensor responsesJENTEK SENSORS INC·Filed 2004·Granted Jan 9, 2007·16 cites·29 claims
- 1778US6798198B2Fluid supports for sensorsJENTEK SENSORS INC·Filed 2003·Granted Sep 28, 2004·13 cites·31 claims
- 1877US7526964B2Applied and residual stress measurements using magnetic field sensorsJENTEK SENSORS INC·Filed 2003·Granted May 5, 2009·19 cites·23 claims
- 1976US7095224B2Process control and damage monitoringJENTEK SENSORS INC·Filed 2004·Granted Aug 22, 2006·19 cites·37 claims
- 2068US8768657B2Remaining life prediction for individual components from sparse dataGOLDFINE NEIL J·Filed 2007·Granted Jul 1, 2014·8 cites·27 claims
- 2163US8981018B2Internal material condition monitoring for controlGOLDFINE NEIL J·Filed 2005·Granted Mar 17, 2015·4 cites·22 claims
- 2260US5527471AIridium material for hydrothermal oxidation environmentsMODAR INC·Filed 1995·Granted Jun 18, 1996·21 cites·24 claims
- 2354US2007114993A1Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2005·Application pending·0 cites
- 2453US2007227255A1Self-monitoring metals, alloys and materialsGOLDFINE NEIL J·Filed 2007·Application pending·0 cites
- 2552US2005083050A1Fluid supports for sensorsJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 2652US2004056654A1Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 2751US2005007106A1Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 2849US2015160144A1Internal material condition monitoring for controlJENTEK SENSORS INC·Filed 2015·Application pending·0 cites
- 2945US2004004475A1High throughput absolute flaw imagingJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 3040US2005017713A1Weld characterization using eddy current sensors and arraysJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 3139US2004225474A1Damage tolerance using adaptive model-based methodsJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 3237US7533575B2Quasistatic magnetic and electric field stress/strain gagesJENTEK SENSORS INC·Filed 2007·Granted May 19, 2009·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Vladimir A. Zilberstein files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →