Inventor · disambiguated record
Volker Kilian
Also filed as: KILIAN VOLKER
8 granted patents·77 citations·filing 1997–2006
86Inventor score
Top patents by PatentIndex Score
8 records- 0185US6870392B2Method for generating test signals for an integrated circuit and test logic unitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 22, 2005·33 cites·31 claims
- 0267US6867597B2Method and apparatus for finding a fault in a signal path on a printed circuit boardINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 15, 2005·14 cites·10 claims
- 0365US7349253B2Memory device and method for testing memory devices with repairable redundancyINFINEON TECHNOLOGIES AG·Filed 2006·Granted Mar 25, 2008·6 cites·25 claims
- 0463US7398444B2Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methodsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 8, 2008·4 cites·24 claims
- 0561US7184339B2Semi-conductor component, as well as a process for the in-or output of test dataINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 27, 2007·5 cites·10 claims
- 0646US6600331B2Method and device for measuring a temperature in an electronic componentINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jul 29, 2003·2 cites·12 claims
- 0743US5786694AGradient coil system for use in a diagnostic magnetic resonance apparatusSIEMENS AG·Filed 1997·Granted Jul 28, 1998·11 cites·14 claims
- 0837US7113015B2Circuit for setting a signal propagation time for a signal on a signal line and method for ascertaining timing parametersINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 26, 2006·2 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →