Inventor · disambiguated record
Wan-Chun Fang
Also filed as: FANG WAN-CHUN
3 granted patents·2 pending applications·2 citations·filing 2021–2025
52Inventor score
Files withNANYA TECHNOLOGY CORP5
Top patents by PatentIndex Score
5 records- 0183US11598806B2Test apparatus and test method to a memory deviceNANYA TECHNOLOGY CORP·Filed 2021·Granted Mar 7, 2023·2 cites·12 claims
- 0279US2025370892A1System and method for testing memory deviceNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0367US2025239319A1System and method for testing memory deviceNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0463US12417157B2System and method for testing memory deviceNANYA TECHNOLOGY CORP·Filed 2023·Granted Sep 16, 2025·0 cites·8 claims
- 0561US12308086B2System and method for testing memory deviceNANYA TECHNOLOGY CORP·Filed 2023·Granted May 20, 2025·0 cites·16 claims
Join the waitlist — get patent alerts
Get an alert when Wan-Chun Fang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →