Inventor · disambiguated record
Wade L. Fite
Also filed as: BRACKMANN RICHARD T · FITE WADE L
12 granted patents·404 citations·filing 1974–1991
93Inventor score
Top patents by PatentIndex Score
12 records- 0197US4209696AMethods and apparatus for mass spectrometric analysis of constituents in liquidsFITE WADE L·Filed 1979·Granted Jun 24, 1980·148 cites·42 claims
- 0289US5142143AMethod and apparatus for preconcentration for analysis purposes of trace constitutes in gasesEXTREL CORP·Filed 1991·Granted Aug 25, 1992·118 cites·25 claims
- 0389US3937954AMethods and apparatus for spatial separation of AC and DC electric fields, with application to fringe fields in quadrupole mass filtersEXTRANUCLEAR LAB INC·Filed 1974·Granted Feb 10, 1976·27 cites·30 claims
- 0482US4013887AMethods and apparatus for spatial separation of ac and dc electric fields with application to fringe fields in quadrupole mass filtersFITE WADE L·Filed 1975·Granted Mar 22, 1977·20 cites·5 claims
- 0578US3936634AMethod and apparatus for improved focusing of ion currents in quadrupole mass filterEXTRANUCLEAR LAB INC·Filed 1974·Granted Feb 3, 1976·16 cites·22 claims
- 0676US3973121ADetector for heavy ions following mass analysisFITE WADE L·Filed 1974·Granted Aug 3, 1976·15 cites·17 claims
- 0775US4814613ACollision cell for triple quadrupole tandem mass spectrometryEXTREL CORP·Filed 1987·Granted Mar 21, 1989·20 cites·20 claims
- 0873US4146787AMethods and apparatus for energy analysis and energy filtering of secondary ions and electronsEXTRANUCLEAR LAB INC·Filed 1977·Granted Mar 27, 1979·14 cites·13 claims
- 0958US4093855ADetector for heavy ions following mass analysisEXTRANUCLEAR LAB INC·Filed 1976·Granted Jun 6, 1978·8 cites·10 claims
- 1051US4209693ASurface ionization monitor for particulates and methodEXTRANUCLEAR LABS INC·Filed 1978·Granted Jun 24, 1980·6 cites·16 claims
- 1151US4151414AMethod and apparatus for detection of extremely small particulate matter and vaporsEXTRANUCLEAR LABS INC·Filed 1977·Granted Apr 24, 1979·6 cites·19 claims
- 1236US4162404AMethod and apparatus for surface ionization monitor for particulatesEXTRANUCLEAR LABS INC·Filed 1978·Granted Jul 24, 1979·6 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →