Inventor · disambiguated record
Walter R. Hogg
Also filed as: BRUNSTING ALBERT · HOGG WALTER R
35 granted patents·1,145 citations·filing 1973–1986
98Inventor score
Top patents by PatentIndex Score
35 records- 0198US3963606ASemi-automatic adjusting delay for an electronic particle separatorCOULTER ELECTRONICS·Filed 1974·Granted Jun 15, 1976·105 cites·13 claims
- 0296US4341471AApparatus and method for measuring the distribution of radiant energy produced in particle investigating systemsCOULTER ELECTRONICS·Filed 1979·Granted Jul 27, 1982·94 cites·84 claims
- 0396US3982182AConductivity cell for particle study deviceCOULTER ELECTRONICS·Filed 1975·Granted Sep 21, 1976·76 cites·15 claims
- 0495US4273443AMethod and apparatus for measurement of reradiation in particle flow cell systemsCOULTER ELECTRONICS·Filed 1979·Granted Jun 16, 1981·71 cites·32 claims
- 0595US4189236AEllipsoid-conic radiation collector and methodCOULTER ELECTRONICS·Filed 1978·Granted Feb 19, 1980·97 cites·15 claims
- 0695US4009435AApparatus for preservation and identification of particles analyzed by flow-through apparatusCOULTER ELECTRONICS·Filed 1975·Granted Feb 22, 1977·73 cites·30 claims
- 0794US3973196AMethod and apparatus for ejecting a metered amount of particulate sampleCOULTER ELECTRONICS·Filed 1975·Granted Aug 3, 1976·66 cites·22 claims
- 0892US4395676AFocused aperture moduleCOULTER ELECTRONICS·Filed 1980·Granted Jul 26, 1983·85 cites·14 claims
- 0991US4523841ARadiant energy reradiating flow cell system and methodCOULTER ELECTRONICS·Filed 1979·Granted Jun 18, 1985·54 cites·6 claims
- 1088US4188543AEllipsoid radiation collector apparatus and methodCOULTER ELECTRONICS·Filed 1978·Granted Feb 12, 1980·51 cites·21 claims
- 1185US4199686ADark field illuminator and collector apparatus and methodCOULTER ELECTRONICS·Filed 1978·Granted Apr 22, 1980·37 cites·27 claims
- 1284US4009443AMethod and apparatus for providing primary coincidence correction during particle analysis utilizing time generation techniquesCOULTER ELECTRONICS·Filed 1975·Granted Feb 22, 1977·22 cites·21 claims
- 1383US3987391AMethod and apparatus for correcting total particle volume error due to particle coincidenceCOULTER ELECTRONICS·Filed 1974·Granted Oct 19, 1976·30 cites·20 claims
- 1479US4286876AApparatus and method for measuring scattering of light in particle detection systemsCOULTER ELECTRONICS·Filed 1979·Granted Sep 1, 1981·30 cites·30 claims
- 1576US4188542AMirror image ellipsoid radiation collector and methodCOULTER ELECTRONICS·Filed 1978·Granted Feb 12, 1980·29 cites·24 claims
- 1667US3988128AElectric particle precipitatorCOULTER ELECTRONICS·Filed 1974·Granted Oct 26, 1976·18 cites·16 claims
- 1767US3936741AMethod and apparatus for providing primary coincidence correction during particle analysis utilizing time generation techniquesCOULTER ELECTRONICS·Filed 1974·Granted Feb 3, 1976·14 cites·25 claims
- 1866US4341993AReflector optics with impedance sensing orificeCOULTER ELECTRONICS·Filed 1980·Granted Jul 27, 1982·22 cites·16 claims
- 1964US4019134AParticle detector independent of errors caused by changes of electrolyte conductivity and electrode polarizationCOULTER ELECTRONICS·Filed 1976·Granted Apr 19, 1977·15 cites·18 claims
- 2064US3949198AMethods and apparatuses for correcting coincidence count inaccuracies in a coulter type of particle analyzerCOULTER ELECTRONICS·Filed 1974·Granted Apr 6, 1976·16 cites·36 claims
- 2164US3939409AParticle study device and sample metering means used thereinCOULTER ELECTRONICS·Filed 1974·Granted Feb 17, 1976·13 cites·34 claims
- 2262US4184766AMethod and apparatus for correlating measurements of tandem sensing zonesCOULTER ELECTRONICS·Filed 1976·Granted Jan 22, 1980·16 cites·8 claims
- 2362US3936740AMethod and apparatus for automatically sampling pulses a predetermined average number of times for storage and subsequent reproductionCOULTER ELECTRONICS·Filed 1974·Granted Feb 3, 1976·11 cites·30 claims
- 2461US3936739AMethod and apparatus for generating error corrected signalsCOULTER ELECTRONICS·Filed 1974·Granted Feb 3, 1976·11 cites·32 claims
- 2559US4438390ATandem sensing zones for improved signal-to-noise ratio in particle analyzerCOULTER ELECTRONICS·Filed 1981·Granted Mar 20, 1984·17 cites·18 claims
- 2659US3963983APulse amplitude discriminating circuitCOULTER ELECTRONICS·Filed 1973·Granted Jun 15, 1976·13 cites·12 claims
- 2759US3955436ALiquid sampling and container handling apparatusPARTICLE TECHNOLOGY INC·Filed 1975·Granted May 11, 1976·18 cites·26 claims
- 2856US3944797AMethod and apparatus for determining the correct percentiles of the size distribution of a particulate systemCOULTER ELECTRONICS·Filed 1974·Granted Mar 16, 1976·12 cites·26 claims
- 2939US3940691AParticle analyzer of the coulter type including coincidence error correction circuitryCOULTER ELECTRONICS·Filed 1974·Granted Feb 24, 1976·5 cites·19 claims
- 3039US3936666AApparatus for measuring a particle size dividing one of the mass or particle number of a particulate system into predetermined fractionsCOULTER ELECTRONICS·Filed 1974·Granted Feb 3, 1976·6 cites·21 claims
- 3138US4730155ASampling valve including sample ejection meansCOULTER ELECTRONICS·Filed 1986·Granted Mar 8, 1988·6 cites·24 claims
- 3237US3968429AParticle analyzer of the Coulter type including coincidence error correction circuitryCOULTER ELECTRONICS·Filed 1975·Granted Jul 6, 1976·5 cites·16 claims
- 3334US4361803AApparatus for recirculating sweep flow electrolyte without a pumpCOULTER ELECTRONICS·Filed 1980·Granted Nov 30, 1982·4 cites·11 claims
- 3434US3973108APulse storing and retrieval circuitCOULTER ELECTRONICS·Filed 1974·Granted Aug 3, 1976·2 cites·21 claims
- 3531US4077749ASample ejection system including temperature controlCOULTER ELECTRONICS·Filed 1975·Granted Mar 7, 1978·1 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →