Inventor · disambiguated record
Walter Hubbard
Also filed as: HUBBARD WALTER · HUBBARD WALTER B · HUBBARD WALTER BRYAN
4 granted patents·1 pending application·91 citations·filing 1997–2018
77Inventor score
Top patents by PatentIndex Score
5 records- 0177US5898479ASystem for monitoring optical properties of photolithography equipmentVLSI TECHNOLOGY INC·Filed 1997·Granted Apr 27, 1999·57 cites·38 claims
- 0272US6412326B1Semiconductor calibration structures, semiconductor calibration wafers, calibration methods of calibrating semiconductor wafer coating systems, semiconductor processing methods of ascertaining layer alignment during processing and calibration methods ofPHILIPS ELECTRONICS NA·Filed 1999·Granted Jul 2, 2002·27 cites·5 claims
- 0344US6094965ASemiconductor calibration structures and calibration wafers for ascertaining layer alignment during processing and calibrating multiple semiconductor wafer coating systemsVLSI TECHNOLOGY INC·Filed 1998·Granted Aug 1, 2000·7 cites·29 claims
- 0436US2002029608A1Semiconductor calibration structures, semiconductor calibration wafers, calibration methods of calibrating semiconductor wafer coating systems, semiconductor processing methods of ascertaining layer alignment during processing and calibration methods of calibrating multiple semiconductor wafer coating systemsFiled 2001·Application pending·0 cites
- 0533US10571212B1Lodged projectile removal chargeUS NAVY·Filed 2018·Granted Feb 25, 2020·0 cites·22 claims
Join the waitlist — get patent alerts
Get an alert when Walter Hubbard files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →