Inventor · disambiguated record
Walter Huber
Also filed as: HUBER WALTER · HUBER WALTER HENRY
43 granted patents·817 citations·filing 1977–2019
98Inventor score
Files withHEIDENHAIN GMBH DR JOHANNES27BASF AG2DNS ELECTRONIC MATERIALS INC2HUBER WALTER2CIBA GEIGY CORP1
Top patents by PatentIndex Score
43 records- 0192US4851358ASemiconductor wafer fabrication with improved control of internal gettering sites using rapid thermal annealingDNS ELECTRONIC MATERIALS INC·Filed 1988·Granted Jul 25, 1989·149 cites·8 claims
- 0290US4868133ASemiconductor wafer fabrication with improved control of internal gettering sites using RTADNS ELECTRONIC MATERIALS INC·Filed 1989·Granted Sep 19, 1989·107 cites·6 claims
- 0386US6198534B1Scanning unit for an optical position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1998·Granted Mar 6, 2001·55 cites·29 claims
- 0484US6541761B1Optical position measuring system with a graduation that causes essentially only first orders of diffractionJOHANNAS HEIDENHAIN GMBH DR·Filed 2000·Granted Apr 1, 2003·29 cites·27 claims
- 0583US4333356AMixing apparatusCIBA GEIGY CORP·Filed 1980·Granted Jun 8, 1982·56 cites·11 claims
- 0679US5424833AInterferential linear and angular displacement apparatus having scanning and scale grating respectively greater than and less than the source wavelengthHEIDENHAIN GMBH DR JOHANNES·Filed 1993·Granted Jun 13, 1995·36 cites·36 claims
- 0778US8822907B2Optical position-measuring device having two crossed scalesJOERGER RALPH·Filed 2011·Granted Sep 2, 2014·5 cites·14 claims
- 0876US5430546AOptical device for measuring relative position of or angle between two objectsHEIDENHAIN GMBH DR JOHANNES·Filed 1991·Granted Jul 4, 1995·32 cites·13 claims
- 0975US9080857B2Device for interferential distance measurementHUBER WALTER·Filed 2011·Granted Jul 14, 2015·4 cites·27 claims
- 1074US6552810B1Optical measuring systemJOHANNES HIEDENHEIN GMBH DR·Filed 2000·Granted Apr 22, 2003·21 cites·19 claims
- 1174US5648658AApparatus and method for generating position-dependent signals using a scanning plate having a plurality of differently configured scanning regionsHEIDENHAIN GMBH DR JOHANNES·Filed 1995·Granted Jul 15, 1997·32 cites·36 claims
- 1273US4165219AAnalysis of solutions using chromatographic columnBASF AG·Filed 1977·Granted Aug 21, 1979·23 cites·4 claims
- 1371US6175414B1Optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 1999·Granted Jan 16, 2001·30 cites·11 claims
- 1470US5678319AIndex grating having partial fields that are geometrically offset in the measuring directionHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Oct 21, 1997·28 cites·12 claims
- 1567US8797546B2Interferometric distance measurement device using a scanning plate and transparent carrier substrate containing a reflector elementHUBER WALTER·Filed 2012·Granted Aug 5, 2014·3 cites·13 claims
- 1667US7154609B2Interferential position measuring arrangementHEIDENHAIN GMBH DR JOHANNES·Filed 2003·Granted Dec 26, 2006·12 cites·32 claims
- 1766US7701593B2Optical position measuring arrangementHEIDENHAIN GMBH DR JOHANNES·Filed 2008·Granted Apr 20, 2010·4 cites·21 claims
- 1864US8465805B2Glass veneer on ceramicsHUBER WALTER HENRY·Filed 2008·Granted Jun 18, 2013·2 cites·48 claims
- 1963US7196431B2Device for prompting a controllerDAIMLER CHRYSLER AG·Filed 2004·Granted Mar 27, 2007·10 cites·12 claims
- 2062US5739911APosition measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Apr 14, 1998·21 cites·25 claims
- 2160US9739598B2Device for interferential distance measurementHEIDENHAIN GMBH DR JOHANNES·Filed 2014·Granted Aug 22, 2017·1 cites·14 claims
- 2259US4623942AMethod and arrangement for detecting error signals in a disk-drive, and a magnetic test disk thereforBASF AG·Filed 1985·Granted Nov 18, 1986·13 cites·13 claims
- 2355US10823550B2Optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2019·Granted Nov 3, 2020·0 cites·11 claims
- 2455US5264915AInterferential measurement device for at least one direction of measurementHEIDENHAIN GMBH DR JOHANNES·Filed 1991·Granted Nov 23, 1993·15 cites·24 claims
- 2554US5760959AInterferential position measuring device with three detectorsHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Jun 2, 1998·17 cites·5 claims
- 2653US5696584APhase grating having an unprotected relief structure with a grating structure that causes destructive interference of reflectionsHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Dec 9, 1997·17 cites·5 claims
- 2753US5206704APosition measuring apparatus and method of use thereofHEIDENHAIN GMBH DR JOHANNES·Filed 1991·Granted Apr 27, 1993·16 cites·47 claims
- 2852US5689336APhotoelectric position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Nov 18, 1997·15 cites·14 claims
- 2952US5493397AMulti-coordinate measuring system using a cross grating to create a plurality of diffraction beams emanating from two or more coordinate directionsHEIDENHAIN GMBH DR JOHANNES·Filed 1994·Granted Feb 20, 1996·16 cites·19 claims
- 3051US6621069B2Optical encoder with an electric field—screening gritHEIDENHAIN GMBH DR JOHANNES·Filed 2001·Granted Sep 16, 2003·6 cites·12 claims
- 3148US9400168B2Device for distance measurementHEIDENHAIN GMBH DR JOHANNES·Filed 2013·Granted Jul 26, 2016·0 cites·18 claims
- 3247US9823058B2Device for position determinationHEIDENHAIN GMBH DR JOHANNES·Filed 2014·Granted Nov 21, 2017·0 cites·16 claims
- 3347US6511921B1Methods for reducing the reactivity of a semiconductor substrate surface and for evaluating electrical properties of a semiconductor substrateSUMCO PHOENIX CORP·Filed 1999·Granted Jan 28, 2003·17 cites·24 claims
- 3446US10048114B2Device for measuring the vibrational amplitude of a capillary tube of a wire bonderHEIDENHAIN GMBH DR JOHANNES·Filed 2014·Granted Aug 14, 2018·0 cites·8 claims
- 3542US4988864APhotoelectric angle measuring device with adjacent order interferenceHEIDENHAIN GMBH DR JOHANNES·Filed 1990·Granted Jan 29, 1991·8 cites·14 claims
- 3638US7271920B2Position-measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2004·Granted Sep 18, 2007·0 cites·14 claims
- 3738US7159781B2Scanning unit for a position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2006·Granted Jan 9, 2007·0 cites·21 claims
- 3838US4768878ATest arrangement for non-contacting identification of defects in non-structured surfacesSIEMENS AG·Filed 1986·Granted Sep 6, 1988·7 cites·19 claims
- 3937US9638514B2Optical position-measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2015·Granted May 2, 2017·0 cites·16 claims
- 4037US7297935B2Position-measuring deviceJOHNANNES HEIDENHAIN GMBH DR·Filed 2005·Granted Nov 20, 2007·0 cites·30 claims
- 4135US6943341B2Position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 2004·Granted Sep 13, 2005·0 cites·30 claims
- 4234US6151128AOptical position indicatorGMBH JOHANNES HEIDENHAIN·Filed 1997·Granted Nov 21, 2000·7 cites·31 claims
- 4333US5519492AOptical arrangement for detecting the intensity modulation of partial ray beamsHEIDENHAIN GMBH DR JOHANNES·Filed 1993·Granted May 21, 1996·3 cites·39 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →