Inventor · disambiguated record
Walter Jaerisch
Also filed as: JAEERISCH WALTER · JAERISCH WALTER
6 granted patents·138 citations·filing 1977–1981
84Inventor score
Top patents by PatentIndex Score
6 records- 0192US4167337AInterferometric apparatus and processIBM·Filed 1977·Granted Sep 11, 1979·67 cites·8 claims
- 0277US4188124AInterferometric measuring systemIBM·Filed 1977·Granted Feb 12, 1980·28 cites·3 claims
- 0369US4386849AMethod of moire-metrical testing of optical imaging systemsIBM·Filed 1981·Granted Jun 7, 1983·22 cites·11 claims
- 0447US4221486AInterferometric measurement with λ/4 resolutionMAKOSCH GUENTER·Filed 1978·Granted Sep 9, 1980·11 cites·9 claims
- 0537US4429992AMethod and device for testing optical imaging systemsIBM·Filed 1981·Granted Feb 7, 1984·6 cites·18 claims
- 0634US4222669AInterferometer for determining the shape of an objectIBM·Filed 1977·Granted Sep 16, 1980·4 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →