Inventor · disambiguated record
Walter Jarisch
Also filed as: JAERISCH WALTER
3 granted patents·35 citations·filing 1982–1988
70Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0156US4653922AInterferometric thickness analyzer and measuring methodIBM·Filed 1985·Granted Mar 31, 1987·17 cites·4 claims
- 0246US4895447APhase-sensitive interferometric mask-wafer alignmentIBM·Filed 1988·Granted Jan 23, 1990·13 cites·23 claims
- 0335US4541720AApparatus for phase symmetrizing optical wave frontsIBM·Filed 1982·Granted Sep 17, 1985·5 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →