Inventor · disambiguated record
Washington Lamar
Also filed as: LAMAR WASHINGTON
18 granted patents·4 pending applications·193 citations·filing 2005–2024
93Inventor score
Top patents by PatentIndex Score
22 records- 0198US7694200B2Integrated circuit having built-in self-test featuresALLEGRO MICROSYSTEMS INC·Filed 2007·Granted Apr 6, 2010·91 cites·26 claims
- 0295US7253614B2Proximity detector having a sequential flow state machineALLEGRO MICROSYSTEMS INC·Filed 2005·Granted Aug 7, 2007·55 cites·22 claims
- 0394US9941224B2Multi-die integrated circuit device with capacitive overvoltage protectionALLEGRO MICROSYSTEMS LLC·Filed 2016·Granted Apr 10, 2018·11 cites·18 claims
- 0491US10056364B1Electronic device with adjustable reverse breakdown voltageALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Aug 21, 2018·10 cites·14 claims
- 0588US10468485B2Metal-oxide semiconductor (MOS) device structure based on a poly-filled trench isolation regionALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Nov 5, 2019·5 cites·48 claims
- 0682US11195826B2Electrostatic discharge protectionALLEGRO MICROSYSTEMS LLC·Filed 2020·Granted Dec 7, 2021·2 cites·20 claims
- 0779US10608430B2Switched electrical overstress protectionALLEGRO MICROSYSTEMS LLC·Filed 2016·Granted Mar 31, 2020·2 cites·23 claims
- 0879US9866014B2Electronic device with shared EOS protection and power interruption mitigationALLEGRO MICROSYSTEMS LLC·Filed 2015·Granted Jan 9, 2018·2 cites·28 claims
- 0978US10147689B2Multi-die integrated circuit device with capacitive overvoltage protectionALLEGRO MICROSYSTEMS LLC·Filed 2018·Granted Dec 4, 2018·2 cites·9 claims
- 1077US8922962B2Method and apparatus to improve ESD robustness of power clampsLAMAR WASHINGTON·Filed 2012·Granted Dec 30, 2014·5 cites·30 claims
- 1174US10256225B2Gate-less electrostatic discharge systems and methods for formingALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Apr 9, 2019·2 cites·23 claims
- 1274US10145904B2Multi-die integrated circuit device with overvoltage protectionALLEGRO MICROSYSTEMS LLC·Filed 2016·Granted Dec 4, 2018·2 cites·25 claims
- 1373US10943976B2Metal-oxide semiconductor (MOS) device structure based on a poly-filled trench isolation regionALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Mar 9, 2021·1 cites·20 claims
- 1473US10234887B2Output driver having reduced electromagnetic susceptibility and associated methodsALLEGRO MICROSYSTEMS LLC·Filed 2016·Granted Mar 19, 2019·2 cites·21 claims
- 1562US10147688B2Integrated circuit device with overvoltage discharge protectionALLEGRO MICROSYSTEMS LLC·Filed 2016·Granted Dec 4, 2018·1 cites·32 claims
- 1658US2025253284A1Multi-Die Integrated Circuit Device with a Spark GapALLEGRO MICROSYSTEMS LLC·Filed 2024·Application pending·0 cites
- 1755US2025391790A1Spark gap structures and methods in an integrated circuit deviceALLEGRO MICROSYSTEMS LLC·Filed 2024·Application pending·0 cites
- 1854US10649481B2Output driver having reduced electromagnetic susceptibility and associated methodsALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted May 12, 2020·0 cites·12 claims
- 1953US2025267952A1Electrostatic discharge protection for stack die technologyALLEGRO MICROSYSTEMS LLC·Filed 2024·Application pending·0 cites
- 2051US11967650B2Snapback electrostatic discharge protection device with tunable parametersALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Apr 23, 2024·0 cites·17 claims
- 2148US11303116B2Methods and apparatus for electrical overstress protectionALLEGRO MICROSYSTEMS LLC·Filed 2018·Granted Apr 12, 2022·0 cites·12 claims
- 2234US2014176110A1Output Driver Having Reduced Electromagnetic Susceptibility and Associated MethodsLAMAR WASHINGTON·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →