Inventor · disambiguated record
Wan Seob Lee
Also filed as: LEE WAN SEOB
14 granted patents·469 citations·filing 2009–2022
89Inventor score
Top patents by PatentIndex Score
14 records- 0196US10361722B2Semiconductor memory device performing randomization operationSK HYNIX INC·Filed 2017·Granted Jul 23, 2019·39 cites·25 claims
- 0295US8625376B2Semiconductor memory device and method of operation the sameLEE WAN SEOB·Filed 2011·Granted Jan 7, 2014·415 cites·12 claims
- 0376US11373711B2Address counting circuit and semiconductor device including the address counting circuitSK HYNIX INC·Filed 2020·Granted Jun 28, 2022·1 cites·20 claims
- 0472US9628056B1Latch circuit, receiver circuit, semiconductor apparatus and system using the latch and receiver circuitsSK HYNIX INC·Filed 2016·Granted Apr 18, 2017·2 cites·22 claims
- 0569US9196382B2Semiconductor test deviceSK HYNIX INC·Filed 2014·Granted Nov 24, 2015·3 cites·9 claims
- 0667US9318198B2Memory system and method of operating the sameJUNG MIN JOONG·Filed 2011·Granted Apr 19, 2016·4 cites·11 claims
- 0764US8705276B2Semiconductor memory device, reading method thereof, and data storage device having the sameLEE WAN SEOB·Filed 2012·Granted Apr 22, 2014·3 cites·18 claims
- 0861US10726935B2Memory device and operating method thereofSK HYNIX INC·Filed 2019·Granted Jul 28, 2020·1 cites·20 claims
- 0957US9373420B2Semiconductor test deviceSK HYNIX INC·Filed 2015·Granted Jun 21, 2016·1 cites·11 claims
- 1055US11625182B2Storage device and operating method thereofSK HYNIX INC·Filed 2021·Granted Apr 11, 2023·0 cites·18 claims
- 1149US12333878B2Method for setting linking by means of door lock administrator rightEPIC SYSTEMS CO LTD·Filed 2022·Granted Jun 17, 2025·0 cites·7 claims
- 1247US11017844B2Semiconductor memory deviceSK HYNIX INC·Filed 2019·Granted May 25, 2021·0 cites·19 claims
- 1337US9152326B2Semiconductor memory deviceSK HYNIX INC·Filed 2013·Granted Oct 6, 2015·0 cites·12 claims
- 1436US8120977B2Test method for nonvolatile memory deviceLEE WAN SEOB·Filed 2009·Granted Feb 21, 2012·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →