Inventor · disambiguated record
Wayne Needham
Also filed as: NEEDHAM WAYNE · NEEDHAM WAYNE M · NEEDHAM WAYNE MAURICE
7 granted patents·225 citations·filing 1993–2019
86Inventor score
Top patents by PatentIndex Score
7 records- 0191US5570034AUsing hall effect to monitor current during IDDQ testing of CMOS integrated circuitsINTEL CORP·Filed 1994·Granted Oct 29, 1996·120 cites·28 claims
- 0280US6617868B1Method and apparatus for controlling the power and heat output in a device testing systemINTEL CORP·Filed 2000·Granted Sep 9, 2003·28 cites·13 claims
- 0359US5583786AApparatus and method for testing integrated circuitsINTEL CORP·Filed 1993·Granted Dec 10, 1996·35 cites·14 claims
- 0449US5978946AMethods and apparatus for system testing of processors and computers using signature analysisINTEL CORP·Filed 1997·Granted Nov 2, 1999·25 cites·30 claims
- 0547US11321828B2Machine learning system animal age determinationCanyon Equine Services·Filed 2019·Granted May 3, 2022·0 cites·20 claims
- 0642US6408410B1Method and apparatus for built in self-test of buffer circuits for speed related defectsINTEL CORP·Filed 1997·Granted Jun 18, 2002·11 cites·16 claims
- 0735US5990699AMethod for detecting opens through time variant current measurementINTEL CORP·Filed 1996·Granted Nov 23, 1999·6 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →