Inventor · disambiguated record

Wang Jian Ping

Also filed as: PING WANG JIAN

2 granted patents·1 citations·filing 2009–2013

34Inventor score

Technology areasH10P

Files withPING WANG JIAN1 SEMICONDUCTOR MFG INT SHANGHAI CORP1

Top patents by PatentIndex Score

2 records

0149US8415663B2System and method for test structure on a waferPING WANG JIAN·Filed 2009·Granted Apr 9, 2013·1 cites·18 claims
0243US9472476B2System and method for test structure on a waferSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2013·Granted Oct 18, 2016·0 cites·15 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →