Inventor · disambiguated record
Walter Rutten
Also filed as: RUETTEN WALTER · RUTTEN WALTER
11 granted patents·2 pending applications·158 citations·filing 1997–2007
90Inventor score
Top patents by PatentIndex Score
13 records- 0182US6653636B2Sensor and method of operating the sensorKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Nov 25, 2003·24 cites·13 claims
- 0280US6586743B1X-ray detector having sensors and evaluation unitsKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Jul 1, 2003·23 cites·18 claims
- 0379US5905772AX-ray examination apparatus with a semiconductor x-ray detectorPHILIPS CORP·Filed 1997·Granted May 18, 1999·61 cites·24 claims
- 0477US7408166B2X-ray examination apparatus and radiation detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Aug 5, 2008·5 cites·19 claims
- 0574US7346146B2X-ray detector with photo-gates and dose controlKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Mar 18, 2008·3 cites·10 claims
- 0673US8193501B2Detector for and a method of detecting electromagnetic radiationRUTTEN WALTER·Filed 2007·Granted Jun 5, 2012·5 cites·25 claims
- 0770US6947086B1Imaging method and apparatus for imaging with low incident radiationKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Sep 20, 2005·9 cites·4 claims
- 0870US6894283B1Sensor matrixKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted May 17, 2005·10 cites·9 claims
- 0969US6655675B2X-ray detector offering an improved light yieldKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Dec 2, 2003·14 cites·20 claims
- 1052US7301151B2Detector for the temporally resolved recording of detection eventsKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Nov 27, 2007·4 cites·21 claims
- 1149US7521683B2X-ray detectorKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Apr 21, 2009·0 cites·23 claims
- 1246US2007080916A1Circuit for addressing electronic unitsNASCETTI AUGUSTO·Filed 2004·Application pending·0 cites
- 1344US2005218332A1Method of reading out the sensor elements of a sensor, and a sensorRUTTEN WALTER·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →