Inventor · disambiguated record
Warren T. Yu
Also filed as: YU WARREN T
6 granted patents·1 pending application·63 citations·filing 1999–2000
83Inventor score
Files withADVANCED MICRO DEVICES INC6
Top patents by PatentIndex Score
7 records- 0165US6482573B1Exposure correction based on reflective index for photolithographic process controlADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 19, 2002·8 cites·7 claims
- 0250US6345211B1Method of using critical dimension mapping to optimize speed performance of microprocessor produced using an integrated circuit manufacturing processADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 5, 2002·14 cites·7 claims
- 0348US6215127B1Method of using critical dimension mapping to qualify a new integrated circuit fabrication tool setADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 10, 2001·16 cites·5 claims
- 0444US6345210B1Method of using critical dimension mapping to qualify a reticle used in integrated circuit fabricationADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 5, 2002·10 cites·7 claims
- 0542US6238936B1Method of using critical dimension mapping to qualify a new integrated circuit fabrication etch processADVANCED MICRO DEVICES INC·Filed 1999·Granted May 29, 2001·11 cites·6 claims
- 0633US6345209B1Method of using critical dimension mapping to qualify a new integrated circuit manufacturing processADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 5, 2002·4 cites·7 claims
- 0727US2001003673A1Etch bias tuning for enhancement of stepper lifeFiled 1999·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →