Inventor · disambiguated record
Waldermar Zylka
Also filed as: ZYLKA WALDERMAR
2 granted patents·92 citations·filing 2000–2000
67Inventor score
Technology areasA61B
Top patents by PatentIndex Score
2 records- 0170US6379043B1X-ray examination apparatus and method for generating distortion-free X-ray imagesPHILIPS CORP·Filed 2000·Granted Apr 30, 2002·63 cites·9 claims
- 0261US6471399B1X-ray examination device and method for producing undistorted X-ray imagesKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Oct 29, 2002·29 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →