Inventor · disambiguated record
Wei-Fen Chiang
Also filed as: CHIANG WEI-FEN
3 granted patents·2 pending applications·2 citations·filing 2006–2010
50Inventor score
Top patents by PatentIndex Score
5 records- 0153US7830163B2Testing circuit board for testing devices under testPRINCETON TECHNOLOGY CORP·Filed 2008·Granted Nov 9, 2010·2 cites·13 claims
- 0237US8044675B2Testing apparatus with high efficiency and high accuracyPRINCETON TECHNOLOGY CORP·Filed 2010·Granted Oct 25, 2011·0 cites·14 claims
- 0336US8228384B2Circuit testing apparatusTENG CHENG-YUNG·Filed 2006·Granted Jul 24, 2012·0 cites·20 claims
- 0433US2007268037A1Circuit testing apparatusTENG CHENG-YUNG·Filed 2006·Application pending·0 cites
- 0522US2010259278A1Testing circuit boardCHIANG WEI-FEN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →