Inventor · disambiguated record
Weng-Liang Fang
Also filed as: FANG WENG-LIANG
7 granted patents·251 citations·filing 1996–2004
88Inventor score
Files withTAIWAN SEMICONDUCTOR MFG7
Top patents by PatentIndex Score
7 records- 0186US6124212AHigh density plasma (HDP) etch method for suppressing micro-loading effects when etching polysilicon layersTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Sep 26, 2000·101 cites·24 claims
- 0275US6682659B1Method for forming corrosion inhibited conductor layerTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Jan 27, 2004·57 cites·16 claims
- 0366US5770523AMethod for removal of photoresist residue after dry metal etchTAIWAN SEMICONDUCTOR MFG·Filed 1996·Granted Jun 23, 1998·37 cites·14 claims
- 0465US6543988B2Apparatus for clamping and transporting a semiconductor waferTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Apr 8, 2003·12 cites·11 claims
- 0559US5747856AVertical channel masked ROM memory cell with epitaxyTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted May 5, 1998·16 cites·26 claims
- 0658US5783482AMethod to prevent oxide peeling induced by sog etchback on the wafer edgeTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Jul 21, 1998·25 cites·14 claims
- 0750US7141495B2Methods and forming structures, structures and apparatuses for forming structuresTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Nov 28, 2006·3 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →