Inventor · disambiguated record
Wei-En Fu
Also filed as: FU WEI · FU WEI-EN
14 granted patents·3 pending applications·57 citations·filing 2014–2025
88Inventor score
Files withIND TECH RES INST15INNOVATIVE NANOTECH INCORPORATED1SHENZHEN HANGZHI PREC ELECTRONICS CO LTD1
Top patents by PatentIndex Score
17 records- 0196US10151713B2X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereofIND TECH RES INST·Filed 2016·Granted Dec 11, 2018·38 cites·18 claims
- 0294US11867595B2X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrateIND TECH RES INST·Filed 2021·Granted Jan 9, 2024·4 cites·16 claims
- 0394US11579099B2X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrateIND TECH RES INST·Filed 2020·Granted Feb 14, 2023·4 cites·17 claims
- 0489US9625365B2System and method for monitoring particles in solutionIND TECH RES INST·Filed 2015·Granted Apr 18, 2017·5 cites·19 claims
- 0577US9390888B2Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrateIND TECH RES INST·Filed 2015·Granted Jul 12, 2016·3 cites·21 claims
- 0676US9297772B2Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurementsIND TECH RES INST·Filed 2014·Granted Mar 29, 2016·2 cites·12 claims
- 0771US12188883B2X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrateIND TECH RES INST·Filed 2022·Granted Jan 7, 2025·0 cites·28 claims
- 0867US12493004B2Method for determining parameters of three dimensional nanostructure and apparatus applying the sameIND TECH RES INST·Filed 2023·Granted Dec 9, 2025·0 cites·16 claims
- 0966US2025334528A1X-ray apparatus for analyzing three-dimensional nanostructures and method for analyzing three-dimensional nanostructuresIND TECH RES INST·Filed 2024·Application pending·0 cites
- 1062US9847242B2Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurementsIND TECH RES INST·Filed 2014·Granted Dec 19, 2017·1 cites·11 claims
- 1158US12259660B2Inspection method and inspection platform for lithographyIND TECH RES INST·Filed 2022·Granted Mar 25, 2025·0 cites·27 claims
- 1255US2025334400A1Slit-adjustable substrate assisted x-ray leakage method for ultrathin film thickness detection device and measurement method using the sameIND TECH RES INST·Filed 2025·Application pending·0 cites
- 1351US11287253B2Device and method applicable for measuring ultrathin thickness of film on substrateIND TECH RES INST·Filed 2019·Granted Mar 29, 2022·0 cites·20 claims
- 1449US10545082B2Apparatus for mixing solutionINNOVATIVE NANOTECH INCORPORATED·Filed 2016·Granted Jan 28, 2020·0 cites·16 claims
- 1542US10352694B2Contactless dual-plane positioning method and deviceIND TECH RES INST·Filed 2017·Granted Jul 16, 2019·0 cites·12 claims
- 1637US12487257B2Fluxgate current sensor and current measurement methodSHENZHEN HANGZHI PREC ELECTRONICS CO LTD·Filed 2023·Granted Dec 2, 2025·0 cites·6 claims
- 1733US2018128726A1Analysis apparatusIND TECH RES INST·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →