Inventor · disambiguated record
Wen-Hao Hsueh
Also filed as: HSUEH WEN-HAO
2 granted patents·1 pending application·1 citations·filing 2003–2023
30Inventor score
Top patents by PatentIndex Score
3 records- 0155US9535120B2Integrated circuit and method for establishing scan test architecture in integrated circuitMEDIATEK SINGAPORE PTE LTD·Filed 2015·Granted Jan 3, 2017·1 cites·16 claims
- 0246US2024345941A1Core test method and core test circuitMEDIATEK SINGAPORE PTE LTD·Filed 2023·Application pending·0 cites
- 0336US6950999B2Circuitry cross-talk analysis with consideration of signal transitionsVIA TECH INC·Filed 2003·Granted Sep 27, 2005·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →