Inventor · disambiguated record
Werner Kuehnel
Also filed as: KUEHNEL WERNER
12 granted patents·137 citations·filing 1978–2000
91Inventor score
Files withSIEMENS AG12
Top patents by PatentIndex Score
12 records- 0172US6418191B1X-ray apparatus and line connection thereforSIEMENS AG·Filed 2000·Granted Jul 9, 2002·18 cites·22 claims
- 0272US4295049AX-Ray diagnostic generator with an inverter supplying the high-tension transformerSIEMENS AG·Filed 1980·Granted Oct 13, 1981·24 cites·10 claims
- 0363US4982418AX-ray diagnostics installation having a mean image brightness detectorSIEMENS AG·Filed 1989·Granted Jan 1, 1991·19 cites·3 claims
- 0458US4323781ATomographic X-ray diagnostic unit with the secondary of the high voltage transformer rotating with the X-ray sourceSIEMENS AG·Filed 1979·Granted Apr 6, 1982·30 cites·6 claims
- 0551US4274003AX-ray diagnostic generator comprising means for obtaining a signal corresponding to the x-ray tube voltageSIEMENS AG·Filed 1979·Granted Jun 16, 1981·8 cites·1 claims
- 0647US4191994AInverter comprising at least two controllable load thyristorsSIEMENS AG·Filed 1978·Granted Mar 4, 1980·7 cites·2 claims
- 0746US4789998AMedium frequency x-ray diagnostics generator power controlSIEMENS AG·Filed 1987·Granted Dec 6, 1988·9 cites·5 claims
- 0843US4171488AX-ray diagnosis generator comprising an inverter feeding the high voltage transformerSIEMENS AG·Filed 1978·Granted Oct 16, 1979·5 cites·4 claims
- 0940US4191993AInverter comprising at least two controllable load thyristorsSIEMENS AG·Filed 1978·Granted Mar 4, 1980·5 cites·5 claims
- 1038US4218731AInverter comprising at least two controllable load thyristorsSIEMENS AG·Filed 1978·Granted Aug 19, 1980·4 cites·2 claims
- 1135US5914999AHigh-frequency voltage generator for supplying an X-ray tubeSIEMENS AG·Filed 1997·Granted Jun 22, 1999·5 cites·5 claims
- 1232US5894502AHigh-frequency voltage generator for an X-ray tubeSIEMENS AG·Filed 1997·Granted Apr 13, 1999·3 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →