Inventor · disambiguated record
Wen Li
Also filed as: LI WEN · LI WEN RUI
3 granted patents·43 citations·filing 2004–2014
67Inventor score
Top patents by PatentIndex Score
3 records- 0183US7137055B2Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memoryELPIDA MEMORY INC·Filed 2004·Granted Nov 14, 2006·38 cites·15 claims
- 0266US9026969B2Method of designing arrangement of TSV in stacked semiconductor device and designing system for arrangement of TSV in stacked semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted May 5, 2015·3 cites·15 claims
- 0357US8385627B2Method and apparatus for inspecting defects of semiconductor deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Feb 26, 2013·2 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →