Inventor · disambiguated record
Wen Li
Also filed as: LI WEN · LI WEN BING
33 granted patents·4 pending applications·61 citations·filing 2004–2025
95Inventor score
Top patents by PatentIndex Score
37 records- 0193US9177759B2Processing apparatus and method using a scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 3, 2015·16 cites·10 claims
- 0291US10872745B2Charged-particle beam systemHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 22, 2020·7 cites·9 claims
- 0386US10973112B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 6, 2021·5 cites·18 claims
- 0485US8890096B2Measuring/inspecting apparatus and measuring/inspecting method enabling blanking control of electron beamHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 18, 2014·8 cites·14 claims
- 0582US10847344B2Charged particle beam control deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 24, 2020·3 cites·10 claims
- 0680US9368324B2Measurement and inspection deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 14, 2016·4 cites·15 claims
- 0777US10818470B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Oct 27, 2020·2 cites·6 claims
- 0877US7448293B2Control system for driving a motor to perform a plurality of actionsLITE ON TECHNOLOGY CORP·Filed 2006·Granted Nov 11, 2008·5 cites·19 claims
- 0975US10546718B2High voltage power supply device and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jan 28, 2020·2 cites·10 claims
- 1074US9679740B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 13, 2017·2 cites·2 claims
- 1168US9633818B2Charged particle beam apparatus, image forming method using a charged particle beam apparatus, and image processing apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 25, 2017·1 cites·13 claims
- 1267US9859094B2Charged particle beam apparatus and image forming method of charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 2, 2018·1 cites·10 claims
- 1366US9478392B2Charged particle beam apparatus and image generation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 25, 2016·1 cites·10 claims
- 1464US12463008B2Charged particle beam scanning module, charged particle beam device, and computerHITACHI HIGH TECH CORP·Filed 2022·Granted Nov 4, 2025·0 cites·17 claims
- 1563US11810752B2Charged particle beam device and power supply deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Nov 7, 2023·0 cites·15 claims
- 1663US2025292989A1Charged particle beam device and substrate detaching methodHITACHI HIGH TECH CORP·Filed 2025·Application pending·0 cites
- 1761US12456598B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2023·Granted Oct 28, 2025·0 cites·20 claims
- 1860US10229115B2System and method for creating an internationalized web applicationLI WEN BING·Filed 2009·Granted Mar 12, 2019·4 cites·20 claims
- 1956US11842881B2Measurement device and signal processing methodHITACHI HIGH TECH CORP·Filed 2018·Granted Dec 12, 2023·0 cites·4 claims
- 2055US11848171B2Charged particle beam device and charged particle beam device calibration methodHITACHI HIGH TECH CORP·Filed 2022·Granted Dec 19, 2023·0 cites·13 claims
- 2155US10424459B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Sep 24, 2019·0 cites·6 claims
- 2254US11735395B2Charged particle beam device and method of measuring electrical noiseHITACHI HIGH TECH CORP·Filed 2021·Granted Aug 22, 2023·0 cites·20 claims
- 2354US11211225B2Charged particle beam control deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 28, 2021·0 cites·17 claims
- 2453US11694871B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Jul 4, 2023·0 cites·7 claims
- 2551US11898974B2Charged particle beam device, computer, and signal processing method for charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Feb 13, 2024·0 cites·14 claims
- 2650US12132411B2Power supply module and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 29, 2024·0 cites·10 claims
- 2748US11961701B2Charged particle beam device and operation method thereforHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 16, 2024·0 cites·13 claims
- 2848US11017981B2Charged particle beam systemHITACHI HIGH TECH CORP·Filed 2019·Granted May 25, 2021·0 cites·10 claims
- 2946US12198894B2Measurement system and method of setting parameter of charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jan 14, 2025·0 cites·14 claims
- 3044US11967482B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 23, 2024·0 cites·4 claims
- 3144US10692687B2Measurement and inspection deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jun 23, 2020·0 cites·11 claims
- 3244US2022270847A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 3342US10796880B2Charged particle beam device and charged particle beam device noise source determination methodHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 6, 2020·0 cites·10 claims
- 3442US10373797B2Charged particle beam device and image forming method using sameHITACHI HIGH TECH CORP·Filed 2016·Granted Aug 6, 2019·0 cites·12 claims
- 3541US2023010272A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 3638US2005233284A1Optical sight system for use with weapon simulation systemTRAYKOV PANDO·Filed 2004·Application pending·0 cites
- 3736US10559447B2Charged particle beam device with transient signal correction during beam blankingHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 11, 2020·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →