Inventor · disambiguated record
Weiguang Lu
Also filed as: LU WEIGUANG
25 granted patents·302 citations·filing 2005–2021
96Inventor score
Top patents by PatentIndex Score
25 records- 0199US9722613B1Circuit arrangement for and a method of enabling a partial reconfiguration of a circuit implemented in an integrated circuit deviceXILINX INC·Filed 2015·Granted Aug 1, 2017·58 cites·18 claims
- 0295US7218567B1Method and apparatus for the protection of sensitive data within an integrated circuitXILINX INC·Filed 2005·Granted May 15, 2007·43 cites·20 claims
- 0394US8058897B1Configuration of a multi-die integrated circuitLU WEIGUANG·Filed 2010·Granted Nov 15, 2011·28 cites·14 claims
- 0493US8786310B1Partially programming an integrated circuit using control memory cellsLU WEIGUANG·Filed 2012·Granted Jul 22, 2014·31 cites·17 claims
- 0592US10637462B1System and method for SoC power-up sequencingXILINX INC·Filed 2019·Granted Apr 28, 2020·16 cites·20 claims
- 0692US8438436B1Secure design-for-test scan chainsBAKER MATTHEW P·Filed 2010·Granted May 7, 2013·18 cites·20 claims
- 0789US8099625B1Self-checking and self-correcting internal configuration port circuitryTSENG CHEN WEI·Filed 2009·Granted Jan 17, 2012·37 cites·20 claims
- 0888US8384418B1Mitigating the effect of single event transients on input/output pins of an integrated circuit deviceXILINX INC·Filed 2011·Granted Feb 26, 2013·10 cites·9 claims
- 0987US10108376B1Memory initializationXILINX INC·Filed 2017·Granted Oct 23, 2018·6 cites·20 claims
- 1085US8922242B1Single event upset mitigationXILINX INC·Filed 2014·Granted Dec 30, 2014·7 cites·20 claims
- 1183US8635581B1Method and apparatus for single event upset (SEU) detection and correctionXILINX INC·Filed 2013·Granted Jan 21, 2014·8 cites·20 claims
- 1283US8633730B1Power control using global control signal to selected circuitry in a programmable integrated circuitTSENG CHEN W·Filed 2012·Granted Jan 21, 2014·9 cites·20 claims
- 1383US8601306B1Decryption of configuration data for multi-die integrated circuitsLU WEIGUANG·Filed 2010·Granted Dec 3, 2013·7 cites·20 claims
- 1479US10825541B1Built in configuration memory testXILINX INC·Filed 2018·Granted Nov 3, 2020·5 cites·20 claims
- 1578US10305511B1Run length compression and decompression using an alternative value for single occurrences of a run valueXILINX INC·Filed 2018·Granted May 28, 2019·4 cites·20 claims
- 1673US8713409B1Bit error mitigationTSENG CHEN W·Filed 2012·Granted Apr 29, 2014·6 cites·20 claims
- 1768US8536895B2Configuration of a multi-die integrated circuitLU WEIGUANG·Filed 2011·Granted Sep 17, 2013·2 cites·10 claims
- 1867US8103919B1Circuit for and method of repairing defective memoryKUMAR SUBODH·Filed 2009·Granted Jan 24, 2012·6 cites·16 claims
- 1962US9483416B1Secure processor operation using integrated circuit configuration circuitryLU TING·Filed 2010·Granted Nov 1, 2016·1 cites·15 claims
- 2053US12148464B2Current leakage management controller for reading from memory cellsXILINX INC·Filed 2021·Granted Nov 19, 2024·0 cites·19 claims
- 2150US10963170B2Retaining memory during partial reconfigurationXILINX INC·Filed 2019·Granted Mar 30, 2021·0 cites·19 claims
- 2249US10666266B1Configuration engine for a programmable circuitXILINX INC·Filed 2018·Granted May 26, 2020·0 cites·20 claims
- 2346US10763862B1Boundary logic interfaceXILINX INC·Filed 2019·Granted Sep 1, 2020·0 cites·19 claims
- 2442US11386009B2Programmable device configuration memory systemXILINX INC·Filed 2019·Granted Jul 12, 2022·0 cites·20 claims
- 2536US10169264B1Implementing robust readback capture in a programmable integrated circuitXILINX INC·Filed 2017·Granted Jan 1, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →