Inventor · disambiguated record
Weimin Ma
Also filed as: MA WEIMIN
28 granted patents·3 pending applications·489 citations·filing 2003–2023
95Inventor score
Files withDONGFANG JINGYUAN ELECTRON LTD7HANGZHOU HIKVISION DIGITAL TEC7COLORFUL DAYS CO3ZHEJIANG HAILIANG CO LTD3CISCO TECH INC2
Top patents by PatentIndex Score
31 records- 0198US7809351B1Methods and systems for differential billing of services used during a mobile data service sessionCISCO TECH INC·Filed 2006·Granted Oct 5, 2010·175 cites·19 claims
- 0297US8175574B1Methods and systems for selecting one or more charging profiles for a mobile data service sessionPANDA BISWARANJAN·Filed 2006·Granted May 8, 2012·243 cites·18 claims
- 0391US7640023B2System and method for server farm resource allocationCISCO TECH INC·Filed 2006·Granted Dec 29, 2009·26 cites·27 claims
- 0489US11951535B1Casting furnace featuring submerged, mechanical control of liquid levelZHEJIANG HAILIANG CO LTD·Filed 2023·Granted Apr 9, 2024·1 cites·13 claims
- 0588US10652452B2Method for automatic focus and PTZ cameraHANGZHOU HIKVISION DIGITAL TEC·Filed 2017·Granted May 12, 2020·6 cites·13 claims
- 0685US10223615B2Learning based defect classificationDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Mar 5, 2019·6 cites·19 claims
- 0784US10134124B2Reference image contour generationDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Nov 20, 2018·5 cites·18 claims
- 0874US11638071B2Camera assembly and monitoring cameraHANGZHOU HIKVISION DIGITAL TEC·Filed 2020·Granted Apr 25, 2023·1 cites·16 claims
- 0973US11023276B2Method and apparatus for data processingDONGFANG JINGYUAN ELECTRON LTD·Filed 2018·Granted Jun 1, 2021·2 cites·19 claims
- 1072US8718353B2Reticle defect inspection with systematic defect filterLI BING·Filed 2012·Granted May 6, 2014·3 cites·26 claims
- 1170US10042233B2Intelligent adjustment method when video camera performs automatic exposure and apparatus thereforHANGZHOU HIKVISION DIGITAL TEC·Filed 2014·Granted Aug 7, 2018·2 cites·10 claims
- 1267US8165384B1Defect classificationMA WEIMIN·Filed 2003·Granted Apr 24, 2012·10 cites·23 claims
- 1364US10134560B2Multi-stage/multi-chamber electron-beam inspection systemDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Nov 20, 2018·1 cites·20 claims
- 1463US11931797B1Double-acting switch valveZHEJIANG HAILIANG CO LTD·Filed 2023·Granted Mar 19, 2024·0 cites·9 claims
- 1563US11681546B2Method and apparatus for data processingDONGFANG JINGYUAN ELECTRON LTD·Filed 2021·Granted Jun 20, 2023·0 cites·16 claims
- 1661USD903205SPet carrierCOLORFUL DAYS CO·Filed 2018·Granted Nov 24, 2020·8 cites·1 claims
- 1759US9224195B2Reticle defect inspection with systematic defect filterKLA TENCOR CORP·Filed 2014·Granted Dec 29, 2015·0 cites·17 claims
- 1857US10789704B2Abnormality detection for periodic patternsZHONGKE JINGYUAN ELECTRON LTD·Filed 2019·Granted Sep 29, 2020·0 cites·20 claims
- 1954US11628491B2Copper billet horizontal continuous casting apparatus and process with a vertical shaft furnace for smeltingZHEJIANG HAILIANG CO LTD·Filed 2022·Granted Apr 18, 2023·0 cites·20 claims
- 2048US11172140B2Image capture device includes white light lamp and infrared lamp for capturing better quality images when the brightness of the environment is moderateHANGZHOU HIKVISION DIGITAL TEC·Filed 2020·Granted Nov 9, 2021·0 cites·11 claims
- 2148US2025389793A1Method and system for calculating main-loop parameters of slcc, and readable mediumSTATE GRID ECONOMIC AND TECH RESEARCH INSTITUTE CO LTD·Filed 2023·Application pending·0 cites
- 2246US11102393B2Variable magnification method and cameraHANGZHOU HIKVISION DIGITAL TEC·Filed 2019·Granted Aug 24, 2021·0 cites·9 claims
- 2345US9928446B2Augmented automatic defect classificationDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Mar 27, 2018·0 cites·20 claims
- 2444US11934109B2Overlay alignment mark and method for measuring overlay errorZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2021·Granted Mar 19, 2024·0 cites·13 claims
- 2543US7864416B2Portable astronomical telescopeSPIM PREC INSTR MFG CO LTD·Filed 2008·Granted Jan 4, 2011·0 cites·10 claims
- 2640US2019088442A1Electron-Beam Inspection Systems with optimized throughputDONGFANG JINGYUAN ELECTRON LTD·Filed 2018·Application pending·0 cites
- 2739USD1036794SBird toyCOLORFUL DAYS CO·Filed 2021·Granted Jul 23, 2024·0 cites·1 claims
- 2838US11588974B2Zooming method for imaging device, and image processing method and imaging deviceHANGZHOU HIKVISION DIGITAL TEC·Filed 2020·Granted Feb 21, 2023·0 cites·16 claims
- 2938US2021382401A1Overlay alignment mark, method for measuring overlay error, and method for overlay alignmentZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2021·Application pending·0 cites
- 3037US10805539B2Anti-shake method for camera and cameraHANGZHOU HIKVISION DIGITAL TEC·Filed 2017·Granted Oct 13, 2020·0 cites·16 claims
- 3134USD1044146SBird cage coverCOLORFUL DAYS CO·Filed 2020·Granted Sep 24, 2024·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →