Inventor · disambiguated record
Weiwei Pan
Also filed as: PAN WEIWEI
10 granted patents·1 pending application·0 citations·filing 2014–2025
76Inventor score
Files withSEMITRONIX CORP7HEFEI VISIONOX TECH CO LTD2BOE TECHNOLOGY GROUP CO LTD1NANOLATTIX BIOTECHNOLOGY CO LTD1
Top patents by PatentIndex Score
11 records- 0164US12307982B2Method and device for driving a display panel and display deviceHEFEI VISIONOX TECH CO LTD·Filed 2024·Granted May 20, 2025·0 cites·16 claims
- 0262US11668748B2Addressable test chipSEMITRONIX CORP·Filed 2022·Granted Jun 6, 2023·0 cites·14 claims
- 0359US10254339B2Addressable test chip test systemSEMITRONIX CORP·Filed 2017·Granted Apr 9, 2019·0 cites·19 claims
- 0455US12377160B2Humanized anti-tissue factor antibody, antibody-drug conjugate prepared therefrom and use thereofNANOLATTIX BIOTECHNOLOGY CO LTD·Filed 2025·Granted Aug 5, 2025·0 cites·10 claims
- 0555US11243251B2Addressable test system with address registerSEMITRONIX CORP·Filed 2020·Granted Feb 8, 2022·0 cites·16 claims
- 0652US12106718B2Driving method and driving device for a display panel, and display deviceHEFEI VISIONOX TECH CO LTD·Filed 2023·Granted Oct 1, 2024·0 cites·20 claims
- 0744US10156605B2Addressable ring oscillator test chipSEMITRONIX CORP·Filed 2015·Granted Dec 18, 2018·0 cites·18 claims
- 0841US11274971B2Temperature sensorSEMITRONIX CORP·Filed 2019·Granted Mar 15, 2022·0 cites·19 claims
- 0941US2015042372A1Addressable test circuit and test method for key parameters of transistorsSEMITRONIX CORP·Filed 2014·Application pending·0 cites
- 1036US10804694B2Over-temperature protection circuitry and driving methodBOE TECHNOLOGY GROUP CO LTD·Filed 2017·Granted Oct 13, 2020·0 cites·16 claims
- 1136US9817058B2Addressable test circuit and test method for key parameters of transistorsSEMITRONIX CORP·Filed 2016·Granted Nov 14, 2017·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →