Inventor · disambiguated record
Wei Wei Ruan
Also filed as: RUAN WEI WEI
3 granted patents·1 pending application·12 citations·filing 2007–2010
64Inventor score
Technology areasH10P
Top patents by PatentIndex Score
4 records- 0176US7439538B2Multi-purpose poly edge test structureSEMICONDUCTOR MFG INT SHANGHAI·Filed 2007·Granted Oct 21, 2008·6 cites·16 claims
- 0268US8323990B2Reliability test structure for multilevel interconnectSHI WEN·Filed 2007·Granted Dec 4, 2012·5 cites·19 claims
- 0356US8164091B2Multi-purpose poly edge test structureSHI WEN·Filed 2008·Granted Apr 24, 2012·1 cites·12 claims
- 0432US2011074459A1Structure and method for semiconductor testingSEMICONDUCTOR MFG INT SHANGHAI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →