Inventor · disambiguated record
Wei-Jhih Su
Also filed as: SU WEI-JHIH
31 granted patents·9 pending applications·35 citations·filing 2017–2025
93Inventor score
Files withCHUNGHWA PREC TEST TECH CO LTD40
Top patents by PatentIndex Score
40 records- 0195US11226354B1Probe card device and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Jan 18, 2022·6 cites·9 claims
- 0294US11460486B1Probe card device and spring-like probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Oct 4, 2022·3 cites·10 claims
- 0393US11913973B2Cantilever probe card device and focusing probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Feb 27, 2024·4 cites·9 claims
- 0493US11879912B2Cantilever probe card and carrier thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Jan 23, 2024·4 cites·10 claims
- 0592US11561244B2Board-like connector, dual-ring bridge of board-like connector, and wafer testing assemblyCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Jan 24, 2023·2 cites·10 claims
- 0691US12467949B2Cantilever probe card device and light absorption probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Granted Nov 11, 2025·2 cites·10 claims
- 0791US10845385B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Nov 24, 2020·5 cites·6 claims
- 0890US12181496B2Cantilever probe card and probe module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Dec 31, 2024·2 cites·10 claims
- 0990US12092661B2Cantilever probe card device and elastic probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Sep 17, 2024·2 cites·10 claims
- 1088US10613117B2Probe card device and rectangular probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Apr 7, 2020·4 cites·10 claims
- 1173US10605830B2Probe card device and rectangular probe thereof having ring-shaped branch segmentCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Mar 31, 2020·1 cites·11 claims
- 1258US11988686B2Vertical probe card and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted May 21, 2024·0 cites·10 claims
- 1358US2025283915A1Probe card device having expansion configuration and probe head thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 1458US2025283914A1Probe card device having heat-dissipation configuration and guide board module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 1558US2025283912A1Probe card device having parallel connection configuration and guide board mechanism thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 1656US2024385217A1Cantilever probe card device and climb-restricting probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Application pending·0 cites
- 1756US2024385222A1Cantilever probe card device and cantilever probe moduleCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Application pending·0 cites
- 1855US12111336B2Modular vertical probe cardCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Oct 8, 2024·0 cites·9 claims
- 1953US12203961B2Vertical probe card device and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Jan 21, 2025·0 cites·8 claims
- 2053US12146897B2Vertical probe card having different probesCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Nov 19, 2024·0 cites·9 claims
- 2153US11747395B2Board-like connector, single-arm bridge of board-like connector, and wafer testing assemblyCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Sep 5, 2023·0 cites·10 claims
- 2252US11506685B1Probe card device and disposable adjustment film thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Nov 22, 2022·0 cites·10 claims
- 2351US11699871B2Board-like connector, dual-arm bridge of board-like connector, and wafer testing assemblyCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Jul 11, 2023·0 cites·10 claims
- 2451US11592466B2Probe card device and self-aligned probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Feb 28, 2023·0 cites·8 claims
- 2550US11536744B2Probe card device and dual-arm probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Dec 27, 2022·0 cites·8 claims
- 2649US10509057B2Probe assembly and probe structure thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Dec 17, 2019·0 cites·22 claims
- 2747US11209461B2Probe card device and neck-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Dec 28, 2021·0 cites·8 claims
- 2845US11204371B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Dec 21, 2021·0 cites·6 claims
- 2945US11009526B2Probe card device and three-dimensional signal transfer structure thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted May 18, 2021·0 cites·8 claims
- 3044US11073537B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Jul 27, 2021·0 cites·7 claims
- 3144US2022011346A1Probe card device and fan-out probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Application pending·0 cites
- 3243US11041883B2Probe card device and rectangular probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Jun 22, 2021·0 cites·6 claims
- 3343US10901001B2Probe card device and probe headCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Jan 26, 2021·0 cites·6 claims
- 3441US10670630B2Probe card device and rectangular probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Jun 2, 2020·0 cites·9 claims
- 3541US10615768B2Probe assembly and capacitive space transformer thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Apr 7, 2020·0 cites·11 claims
- 3641US10401388B2Probe card device and rectangular probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Sep 3, 2019·0 cites·10 claims
- 3739US2019101568A1Probe assembly and capacitive probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Application pending·0 cites
- 3839US2019137544A1Probe assembly and engaged-type capacitive probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Application pending·0 cites
- 3938US2019086443A1Probe card device and round probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Application pending·0 cites
- 4035US11175312B2Staggered probe cardCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Nov 16, 2021·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →