Inventor · disambiguated record
Weiqiang Sun
Also filed as: SUN WEIQIANG
8 granted patents·1 pending application·15 citations·filing 2016–2022
78Inventor score
Files withZHONGKE JINGYUAN ELECTRON LTD BEIJING CN4DONGFANG JINGYUAN ELECTRON LTD3GUANGDONG WELDING INST CHINA UKRAINE E O PATON INST OF WELDING1ZHONGKE JINGYUAN ELECTRON LTD1
Top patents by PatentIndex Score
9 records- 0192US10347460B2Patterned substrate imaging using multiple electron beamsDONGFANG JINGYUAN ELECTRON LTD·Filed 2018·Granted Jul 9, 2019·10 cites·21 claims
- 0286US11239044B2Wien filter and charged particle beam imaging apparatusZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2020·Granted Feb 1, 2022·2 cites·20 claims
- 0385US11295928B2Multi-pole deflector for charged particle beam and charged particle beam imaging apparatusZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2020·Granted Apr 5, 2022·2 cites·16 claims
- 0466US11756761B2Wien filter and charged particle beam imaging apparatusZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2022·Granted Sep 12, 2023·0 cites·18 claims
- 0564US10134560B2Multi-stage/multi-chamber electron-beam inspection systemDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Nov 20, 2018·1 cites·20 claims
- 0649US11908658B2Scanning electron microscope device and electron beam inspection apparatusZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2021·Granted Feb 20, 2024·0 cites·16 claims
- 0747US11908657B2Scanning electron microscope device and electron beam inspection apparatusZHONGKE JINGYUAN ELECTRON LTD·Filed 2021·Granted Feb 20, 2024·0 cites·18 claims
- 0840US2019088442A1Electron-Beam Inspection Systems with optimized throughputDONGFANG JINGYUAN ELECTRON LTD·Filed 2018·Application pending·0 cites
- 0931US11084118B2Method and system of all-position plasma welding process for titanium alloy pipelineGUANGDONG WELDING INST CHINA UKRAINE E O PATON INST OF WELDING·Filed 2018·Granted Aug 10, 2021·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →