Inventor · disambiguated record
Wei Chean Tan
Also filed as: TAN Wei Chean
6 granted patents·2 pending applications·0 citations·filing 2019–2023
64Inventor score
Files withHITACHI HIGH TECH CORP8
Top patents by PatentIndex Score
8 records- 0162US12354830B2Sample image display system and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 8, 2025·0 cites·13 claims
- 0261US12169182B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2023·Granted Dec 17, 2024·0 cites·6 claims
- 0354US11747292B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 5, 2023·0 cites·12 claims
- 0451US12368017B2Charged particle beam apparatus and focus adjusting method thereforHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 22, 2025·0 cites·11 claims
- 0546US2024304563A1Position Specification Method, Position Specification Program, and Inspection ApparatusHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0645US12046446B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 23, 2024·0 cites·13 claims
- 0745US2024412941A1Lamella Mounting Method, and Analysis SystemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0838US12051563B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 30, 2024·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →