Inventor · disambiguated record
Wei-Chen Teo
Also filed as: TEO WEI-CHEN
10 granted patents·68 citations·filing 2008–2016
86Inventor score
Top patents by PatentIndex Score
10 records- 0189US8046528B2Data writing method for flash memory, and flash memory controller and storage device thereofPHISON ELECTRONICS CORP·Filed 2008·Granted Oct 25, 2011·23 cites·13 claims
- 0285US8332576B2Data reading method for flash memory and controller and storage system using the sameCHU CHIEN-HUA·Filed 2008·Granted Dec 11, 2012·16 cites·16 claims
- 0381US8086919B2Controller having flash memory testing functions, and storage system and testing method thereofCHEN BAN-HUI·Filed 2009·Granted Dec 27, 2011·17 cites·23 claims
- 0475US9081662B2Memory storage device, memory controller thereof, and method for programming data thereofTEO WEI-CHEN·Filed 2011·Granted Jul 14, 2015·5 cites·15 claims
- 0575US8819387B2Memory storage device, memory controller, and method for identifying valid dataTEO WEI-CHEN·Filed 2011·Granted Aug 26, 2014·5 cites·27 claims
- 0663US8812772B2Data merging method for non-volatile memory and controller and storage apparatus using the sameTEO WEI-CHEN·Filed 2011·Granted Aug 19, 2014·2 cites·18 claims
- 0752US9519436B1Memory erasing method, memory controller, and memory storage apparatusPHISON ELECTRONICS CORP·Filed 2016·Granted Dec 13, 2016·0 cites·9 claims
- 0848US9460004B2Memory erasing method, memory controller, and memory storage apparatusTEO WEI-CHEN·Filed 2011·Granted Oct 4, 2016·0 cites·12 claims
- 0944US9009389B2Memory management table processing method, memory controller, and memory storage apparatusTEO WEI-CHEN·Filed 2011·Granted Apr 14, 2015·0 cites·19 claims
- 1031US9213597B2Memory storage device, memory controller thereof, and method for programming data thereofTEO WEI-CHEN·Filed 2011·Granted Dec 15, 2015·0 cites·21 claims
Join the waitlist — get patent alerts
Get an alert when Wei-Chen Teo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →