Inventor · disambiguated record
Weihao Wan
Also filed as: WAN WEIHAO
5 granted patents·3 pending applications·2 citations·filing 2018–2022
60Inventor score
Files withNCS TESTING TECH CO LTD3CENTRAL IRON AND STEEL RES INSTITUTE2THE NCS TESTING TECH CO LTD2CENTRAL IRON & STEEL RES INST1
Top patents by PatentIndex Score
8 records- 0189US11927511B2Method for statistical distribution characterization of dendritic structures in original position of single crystal superalloyNCS TESTING TECH CO LTD·Filed 2022·Granted Mar 12, 2024·2 cites·8 claims
- 0255US2021356369A1High throughput statistical characterization method of metal micromechanical propertiesNCS TESTING TECH CO LTD·Filed 2021·Application pending·0 cites
- 0347US2021033549A1FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATION METHOD FOR MICROSTRUCTURES of y' PHASES IN METAL MATERIALCENTRAL IRON AND STEEL RES INSTITUTE·Filed 2020·Application pending·0 cites
- 0445US2023184703A1Quantitative statistical characterization method of micron-level second phase in aluminum alloy based on deep learningCENTRAL IRON & STEEL RES INST·Filed 2021·Application pending·0 cites
- 0543US12019025B2Apparatus and method for preparing glow discharge sputtering samples for material microscopic characterizationNCS TESTING TECH CO LTD·Filed 2021·Granted Jun 25, 2024·0 cites·15 claims
- 0641US11506650B2Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materialsTHE NCS TESTING TECH CO LTD·Filed 2020·Granted Nov 22, 2022·0 cites·12 claims
- 0736US10804073B2Apparatus and method for large-scale high throughput quantitative characterization and three-dimensional reconstruction of material structureTHE NCS TESTING TECH CO LTD·Filed 2019·Granted Oct 13, 2020·0 cites·6 claims
- 0835US10895521B2Full-view-field quantitative statistical distribution characterization method of precipitate particles in metal materialCENTRAL IRON AND STEEL RES INSTITUTE·Filed 2018·Granted Jan 19, 2021·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →