Inventor · disambiguated record
Wenzhe Zou
Also filed as: Zou Wenzhe
1 granted patent·1 pending application·0 citations·filing 2022–2023
1Inventor score
Files withSHANGHAI INST MEASUREMENT & TESTING TECH1SHANGHAI INSTITUE OF MEASUREMENT AND TESTING TECH1
Top patents by PatentIndex Score
2 records- 0140US12332195B2Method for calibrating parameter error of electron probe microanalysis instrumentSHANGHAI INST MEASUREMENT & TESTING TECH·Filed 2022·Granted Jun 17, 2025·0 cites·14 claims
- 0240US2024393560A1Adjustment method and adjustment apparatus for mutual parallelism of two back-to-back gratingsSHANGHAI INSTITUE OF MEASUREMENT AND TESTING TECH·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →