Inventor · disambiguated record
Whee Won Cho
Also filed as: CHO WHEE WON
17 granted patents·11 pending applications·77 citations·filing 2005–2012
92Inventor score
Top patents by PatentIndex Score
28 records- 0190US7682900B2Method of fabricating flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 23, 2010·16 cites·11 claims
- 0288US7629213B2Method of manufacturing flash memory device with void between gate patternsHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Dec 8, 2009·14 cites·8 claims
- 0379US8692376B2Semiconductor device and method of manufacturing the sameKIM JUNG GEUN·Filed 2012·Granted Apr 8, 2014·4 cites·7 claims
- 0477US7851350B2Semiconductor device and method of forming contact plug of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Dec 14, 2010·7 cites·18 claims
- 0574US7504333B2Method of forming bit line of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Mar 17, 2009·4 cites·22 claims
- 0673US7611964B2Method of forming isolation layer of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Nov 3, 2009·7 cites·20 claims
- 0772US7977205B2Method of forming isolation layer of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Jul 12, 2011·3 cites·16 claims
- 0872US7736991B2Method of forming isolation layer of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jun 15, 2010·5 cites·18 claims
- 0970US7892919B2Method of forming isolation layer in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Feb 22, 2011·4 cites·39 claims
- 1068US8148267B2Method of forming isolation layer of semiconductor memory deviceCHO WHEE WON·Filed 2008·Granted Apr 3, 2012·6 cites·13 claims
- 1165US8138077B2Flash memory device and method of fabricating the sameCHO WHEE WON·Filed 2009·Granted Mar 20, 2012·4 cites·31 claims
- 1260US7560340B2Method of manufacturing flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jul 14, 2009·1 cites·8 claims
- 1356US7652352B2Active structure of a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jan 26, 2010·1 cites·8 claims
- 1456US7390714B2Method of manufacturing semiconductor device having tungsten gates electrodeHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Jun 24, 2008·1 cites·13 claims
- 1551US7897504B2Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 1, 2011·0 cites·6 claims
- 1646US7462536B2Method of forming bit line of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Dec 9, 2008·0 cites·13 claims
- 1745US2009001583A1Method of manufacturing semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 1844US7521319B2Method of forming gate of flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Apr 21, 2009·0 cites·12 claims
- 1944US2009004819A1Method of Fabricating Flash Memory DeviceHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 2043US2008102622A1Method of forming metal line in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2143US2009029522A1Method of Forming Isolation Layer of Semiconductor DeviceHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 2242US2008003823A1Method of manufacturing semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2342US2007141842A1Method of Manufacturing Semiconductor DeviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2441US2007264790A1Method of manufacturing semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2541US2008268608A1Method of fabricating a flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 2640US2008268612A1Method of forming isolation layer in semiconductor deviceCHO WHEE WON·Filed 2007·Application pending·0 cites
- 2740US2008220605A1Method of manufacturing flash memory deviceLEE JUNG GU·Filed 2007·Application pending·0 cites
- 2840US2008003745A1Method of manufacturing a flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →