Inventor · disambiguated record
William Baerg
Also filed as: BAERG WILLIAM
4 granted patents·123 citations·filing 1985–1989
80Inventor score
Files withINTEL CORP4
Top patents by PatentIndex Score
4 records- 0181US4980019AEtch-back process for failure analysis of integrated circuitsINTEL CORP·Filed 1989·Granted Dec 25, 1990·28 cites·8 claims
- 0277US4700454AProcess for forming MOS transistor with buried oxide regions for insulationINTEL CORP·Filed 1985·Granted Oct 20, 1987·59 cites·12 claims
- 0358US4654958AProcess for forming isolated silicon regions and field-effect devices on a silicon substrateINTEL CORP·Filed 1985·Granted Apr 7, 1987·27 cites·16 claims
- 0442US4961812AEtch-back apparatus for integrated circuit failure analysisINTEL CORP·Filed 1988·Granted Oct 9, 1990·9 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →