Inventor · disambiguated record
Wilfried Dähn
Also filed as: DAEHN WILFRIED
4 granted patents·60 citations·filing 2000–2000
77Inventor score
Files withINFINEON TECHNOLOGIES AG4
Top patents by PatentIndex Score
4 records- 0172US6539505B1Method of testing a semiconductor memory, and semiconductor memory with a test deviceINFINEON TECHNOLOGIES AG·Filed 2000·Granted Mar 25, 2003·22 cites·4 claims
- 0265US6320804B2Integrated semiconductor memory with a memory unit a memory unit for storing addresses of defective memory cellsINFINEON TECHNOLOGIES AG·Filed 2000·Granted Nov 20, 2001·19 cites·6 claims
- 0363US6601194B1Circuit configuration for repairing a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jul 29, 2003·15 cites·6 claims
- 0448US6949946B1Integrated semiconductor circuit and method for functional testing of pad cellsINFINEON TECHNOLOGIES AG·Filed 2000·Granted Sep 27, 2005·4 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →