Inventor · disambiguated record
Wilfried Hansch
Also filed as: HAENSCH WILFRIED · HANSCH WILFRIED
5 granted patents·79 citations·filing 1991–1997
80Inventor score
Top patents by PatentIndex Score
5 records- 0167US6174741B1Method for quantifying proximity effect by measuring device performanceSIEMENS AG·Filed 1997·Granted Jan 16, 2001·32 cites·13 claims
- 0261US5268317AMethod of forming shallow junctions in field effect transistorsSIEMENS AG·Filed 1991·Granted Dec 7, 1993·34 cites·28 claims
- 0339US5602410AOff-state gate-oxide field reduction in CMOSSIEMENS AG·Filed 1995·Granted Feb 11, 1997·7 cites·8 claims
- 0437US5908310AMethod to form a buried implanted plate for DRAM trench storage capacitorsIBM·Filed 1995·Granted Jun 1, 1999·4 cites·14 claims
- 0532US6180972B1Buried, implanted plate for DRAM trench storage capacitorsIBM·Filed 1996·Granted Jan 30, 2001·2 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →