Inventor · disambiguated record

Willem G. J. Langevel

Also filed as: LANGEVEL WILLEM G J

1 granted patent·21 citations·filing 2014–2014

43Inventor score

Technology areasG01N

Files withRAPISCAN SYSTEMS INC1

Top patents by PatentIndex Score

1 record

0194US9207195B2High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materialsRAPISCAN SYSTEMS INC·Filed 2014·Granted Dec 8, 2015·21 cites·14 claims

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