Inventor · disambiguated record
William B. Penzes
Also filed as: PENZES WILLIAM B
4 granted patents·286 citations·filing 1993–1997
81Inventor score
Files withUS COMMERCE4
Top patents by PatentIndex Score
4 records- 0188US5857258AElectrical test structure and method for measuring the relative locations of conductive features on an insulating substrateUS COMMERCE·Filed 1994·Granted Jan 12, 1999·133 cites·4 claims
- 0285US5602492AElectrical test structure and method for measuring the relative locations of conducting features on an insulating substrateUS COMMERCE·Filed 1994·Granted Feb 11, 1997·108 cites·3 claims
- 0378US5920067AMonocrystalline test and reference structures, and use for calibrating instrumentsUS COMMERCE·Filed 1997·Granted Jul 6, 1999·43 cites·26 claims
- 0426US5373232AMethod of and articles for accurately determining relative positions of lithographic artifactsUS COMMERCE·Filed 1993·Granted Dec 13, 1994·2 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →