Inventor · disambiguated record
Wilson Pradeep
Also filed as: PRADEEP WILSON
20 granted patents·2 pending applications·39 citations·filing 2015–2023
92Inventor score
Top patents by PatentIndex Score
22 records- 0192US11680984B1Control data registers for scan testingTEXAS INSTRUMENTS INC·Filed 2022·Granted Jun 20, 2023·2 cites·20 claims
- 0292US11604221B1Clock shaper circuit for transition fault testingTEXAS INSTRUMENTS INC·Filed 2021·Granted Mar 14, 2023·5 cites·20 claims
- 0391US10184980B2Multiple input signature register analysis for digital circuitryTEXAS INSTRUMENTS INC·Filed 2016·Granted Jan 22, 2019·7 cites·7 claims
- 0489US11073557B2Phase controlled codec block scan of a partitioned circuit deviceTEXAS INSTRUMENTS INC·Filed 2019·Granted Jul 27, 2021·3 cites·12 claims
- 0588US10579454B2Delay fault testing of pseudo static controlsTEXAS INSTRUMENTS INC·Filed 2017·Granted Mar 3, 2020·8 cites·15 claims
- 0688US9535123B2Frequency scaled segmented scan chain for integrated circuitsTEXAS INSTRUMENTS INC·Filed 2015·Granted Jan 3, 2017·4 cites·12 claims
- 0785US11333707B2Testing of integrated circuits during at-speed mode of operationTEXAS INSTRUMENTS INC·Filed 2019·Granted May 17, 2022·3 cites·18 claims
- 0882US11209481B2Multiple input signature register analysis for digital circuitryTEXAS INSTRUMENTS INC·Filed 2018·Granted Dec 28, 2021·2 cites·7 claims
- 0979US10331826B2False path timing exception handler circuitTEXAS INSTRUMENTS INC·Filed 2017·Granted Jun 25, 2019·2 cites·18 claims
- 1075US11879940B2Dynamic generation of ATPG mode signals for testing multipath memory circuitTEXAS INSTRUMENTS INC·Filed 2021·Granted Jan 23, 2024·0 cites·16 claims
- 1174US11933844B2Path based controls for ATE mode testing of multicell memory circuitTEXAS INSTRUMENTS INC·Filed 2021·Granted Mar 19, 2024·0 cites·20 claims
- 1274US11073553B2Dynamic generation of ATPG mode signals for testing multipath memory circuitTEXAS INSTRUMENTS INC·Filed 2018·Granted Jul 27, 2021·2 cites·18 claims
- 1374US10776546B2False path timing exception handler circuitTEXAS INSTRUMENTS INC·Filed 2019·Granted Sep 15, 2020·1 cites·2 claims
- 1470US11519964B2Phase controlled codec block scan of a partitioned circuit deviceTEXAS INSTRUMENTS INC·Filed 2021·Granted Dec 6, 2022·0 cites·20 claims
- 1570US11194944B2False path timing exception handler circuitTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 7, 2021·0 cites·2 claims
- 1669US11768726B2Delay fault testing of pseudo static controlsTEXAS INSTRUMENTS INC·Filed 2021·Granted Sep 26, 2023·0 cites·20 claims
- 1768US11194645B2Delay fault testing of pseudo static controlsTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 7, 2021·0 cites·15 claims
- 1866US12216160B2Clock shaper circuit for transition fault testingTEXAS INSTRUMENTS INC·Filed 2023·Granted Feb 4, 2025·0 cites·20 claims
- 1953US11047910B2Path based controls for ATE mode testing of multicell memory circuitTEXAS INSTRUMENTS INC·Filed 2018·Granted Jun 29, 2021·0 cites·20 claims
- 2051US2025224446A1Custom wrapper cell for hardware testingGOOGLE LLC·Filed 2023·Application pending·0 cites
- 2150US10473717B2Methods and apparatus for test insertion pointsTEXAS INSTRUMENTS INC·Filed 2016·Granted Nov 12, 2019·0 cites·14 claims
- 2250US2015212152A1Testing of integrated circuits during at-speed mode of operationTEXAS INSTRUMENTS INC·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Wilson Pradeep files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →