Inventor · disambiguated record
William D. Schwarz
Also filed as: SCHWARZ WILLIAM · SCHWARZ WILLIAM D
14 granted patents·1 pending application·1,069 citations·filing 1997–2025
95Inventor score
Top patents by PatentIndex Score
15 records- 0198US6067262ARedundancy analysis for embedded memories with built-in self test and built-in self repairLSI LOGIC CORP·Filed 1998·Granted May 23, 2000·507 cites·22 claims
- 0293US7260758B1Method and system for performing built-in self-test routines using an accumulator to store fault informationLSI CORP·Filed 2001·Granted Aug 21, 2007·73 cites·22 claims
- 0391US6255836B1Built-in self-test unit having a reconfigurable data retention testLSI LOGIC CORP·Filed 2000·Granted Jul 3, 2001·52 cites·7 claims
- 0491US5909404ARefresh sampling built-in self test and repair circuitLSI LOGIC CORP·Filed 1998·Granted Jun 1, 1999·95 cites·29 claims
- 0589US7493541B1Method and system for performing built-in-self-test routines using an accumulator to store fault informationLSI CORP·Filed 2007·Granted Feb 17, 2009·20 cites·26 claims
- 0689US6795942B1Built-in redundancy analysis for memories with row and column repairLSI LOGIC CORP·Filed 2000·Granted Sep 21, 2004·55 cites·30 claims
- 0788US6496947B1Built-in self repair circuit with pause for data retention coverageLSI LOGIC CORP·Filed 1999·Granted Dec 17, 2002·75 cites·14 claims
- 0883US6505313B1Multi-condition BISR test mode for memories with redundancyLSI LOGIC CORP·Filed 1999·Granted Jan 7, 2003·60 cites·7 claims
- 0977US7076699B1Method for testing semiconductor devices having built-in self repair (BISR) memoryLSI LOGIC CORP·Filed 2001·Granted Jul 11, 2006·26 cites·18 claims
- 1073US5835429AData retention weak write circuit and method of using sameLSI LOGIC CORP·Filed 1997·Granted Nov 10, 1998·35 cites·10 claims
- 1167US5982681AReconfigurable built-in self test circuitLSI LOGIC CORP·Filed 1997·Granted Nov 9, 1999·53 cites·5 claims
- 1265US2025350511A1Encoding and Decoding for PAM Transmitter and ReceiverAPPLE INC·Filed 2025·Application pending·0 cites
- 1363US12316483B2Encoding and decoding for PAM transmitter and receiverAPPLE INC·Filed 2022·Granted May 27, 2025·0 cites·20 claims
- 1458US6505308B1Fast built-in self-repair circuitLSI LOGIC CORP·Filed 1999·Granted Jan 7, 2003·18 cites·11 claims
- 1542US8700878B2Event triggered memory mapped accessSCHWARZ WILLIAM D·Filed 2009·Granted Apr 15, 2014·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →