Inventor · disambiguated record
William F. Seng
Also filed as: SENG WILLIAM F
7 granted patents·3 pending applications·41 citations·filing 2001–2013
82Inventor score
Top patents by PatentIndex Score
10 records- 0187US7433391B2Spread-spectrum receiver with fast M-sequence transformAEROASTRO INC·Filed 2007·Granted Oct 7, 2008·18 cites·27 claims
- 0281US7411218B2Method and device with durable contact on silicon carbideFAIRCHILD SEMICONDUCTOR·Filed 2005·Granted Aug 12, 2008·10 cites·11 claims
- 0377US9340445B2Optical fibers produced in microgravity environments and method of productionGLOVER RICHARD L·Filed 2013·Granted May 17, 2016·6 cites·10 claims
- 0461US7411219B2Uniform contactFAIRCHILD SEMICONDUCTOR·Filed 2005·Granted Aug 12, 2008·2 cites·21 claims
- 0552US9041010B2Wide band gap semiconductor wafers grown and processed in a microgravity environment and method of productionSENG WILLIAM F·Filed 2013·Granted May 26, 2015·1 cites·11 claims
- 0649US6955978B1Uniform contactFAIRCHILD SEMICONDUCTOR·Filed 2001·Granted Oct 18, 2005·4 cites·22 claims
- 0748US7618884B2Method and device with durable contact on silicon carbideFAIRCHILD SEMICONDUCTOR·Filed 2008·Granted Nov 17, 2009·0 cites·23 claims
- 0847US2008014764A1Low temperature, long term annealing of nickel contacts to lower interfacial resistanceFAIRCHILD SEMICONDUCTOR·Filed 2007·Application pending·0 cites
- 0938US2011318920A1Low temperature, long term annealing of nickel contacts to lower interfacial resistanceSENG WILLIAM F·Filed 2011·Application pending·0 cites
- 1031US2005215041A1Low temperature, long term annealing of nickel contacts to lower interfacial resistanceSENG WILLIAM F·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →