Inventor · disambiguated record
Won Chegal
Also filed as: CHEGAL WON
15 granted patents·1 pending application·36 citations·filing 2004–2020
89Inventor score
Files withKOREA RES INST STANDARDS & SCI8KOREA RES INST OF STANDARDS3CHO HYUN MO2CHO YONG JAI2KOREA RES INSTITUTE OF STANDARD AND SCIENCE1
Top patents by PatentIndex Score
16 records- 0187US9581498B2Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the sameKOREA RES INST STANDARDS & SCI·Filed 2015·Granted Feb 28, 2017·4 cites·9 claims
- 0281US10921241B2Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement methodKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Feb 16, 2021·2 cites·12 claims
- 0378US11493433B2Normal incidence ellipsometer and method for measuring optical properties of sample by using sameKOREA RES INST STANDARDS & SCI·Filed 2019·Granted Nov 8, 2022·2 cites·21 claims
- 0478US8009292B2Single polarizer focused-beam ellipsometerKOREA RES INST OF STANDARDS·Filed 2008·Granted Aug 30, 2011·8 cites·12 claims
- 0574US10317334B2Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the sameKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Jun 11, 2019·2 cites·10 claims
- 0674US8447546B2Measurement of Fourier coefficients using integrating photometric detectorCHO YONG JAI·Filed 2010·Granted May 21, 2013·4 cites·2 claims
- 0771US8004677B2Focused-beam ellipsometerKOREA RES INST OF STANDARDS·Filed 2007·Granted Aug 23, 2011·5 cites·4 claims
- 0870US8705039B2Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometerCHO HYUN MO·Filed 2009·Granted Apr 22, 2014·3 cites·10 claims
- 0968US10145785B2Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the sameKOREA RES INST STANDARDS & SCI·Filed 2014·Granted Dec 4, 2018·1 cites·12 claims
- 1066US8300221B2Minute measuring instrument for high speed and large area and method thereofCHO YONG JAI·Filed 2008·Granted Oct 30, 2012·4 cites·9 claims
- 1162US8705033B2Multi-channel surface plasmon resonance sensor using beam profile ellipsometryCHO HYUN MO·Filed 2009·Granted Apr 22, 2014·1 cites·5 claims
- 1257US11402321B2High-sensitive biosensor chip using high extinction coefficient marker and dielectric substrate, measurement system, and measurement methodKOREA RES INSTITUTE OF STANDARD AND SCIENCE·Filed 2019·Granted Aug 2, 2022·0 cites·11 claims
- 1353US12152982B2Device and method for multi-reflection solution immersed silicon-based microchannel measurementKOREA RES INST STANDARDS & SCI·Filed 2020·Granted Nov 26, 2024·0 cites·11 claims
- 1448US10458901B2Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solutionKOREA RES INST STANDARDS & SCI·Filed 2013·Granted Oct 29, 2019·0 cites·18 claims
- 1545US11719624B2Liquid immersion micro-channel measurement device and measurement method which are based on trapezoidal incident structure prism incident-type siliconKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Aug 8, 2023·0 cites·18 claims
- 1639US2005157295A1Ellipsometry system and method using spectral imagingKOREA RES INST OF STANDARDS·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →