Inventor · disambiguated record
Woon-Sup Choi
Also filed as: CHOI WOON-SUP
5 granted patents·13 citations·filing 2008–2017
72Inventor score
Top patents by PatentIndex Score
5 records- 0185US10088521B2Test board for semiconductor package, test system, and method of manufacturing semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 2, 2018·6 cites·22 claims
- 0266US8476908B2Signal capture system and test apparatus including the sameCHOI WOON-SUP·Filed 2010·Granted Jul 2, 2013·3 cites·15 claims
- 0366US7816937B2Apparatus for testing a semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Oct 19, 2010·3 cites·16 claims
- 0460US8103927B2Field mounting-type test apparatus and method for testing memory component or module in actual PC environmentCHOI IN-HO·Filed 2009·Granted Jan 24, 2012·1 cites·19 claims
- 0548US10203369B2Test board, test equipment, test system, and test methodSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 12, 2019·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →