Inventor · disambiguated record
Wolfgang Ernst
Also filed as: ERNST WOLFGANG
12 granted patents·1 pending application·114 citations·filing 2001–2002
90Inventor score
Files withINFINEON TECHNOLOGIES AG11
Top patents by PatentIndex Score
13 records- 0180US6556492B2System for testing fast synchronous semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 29, 2003·31 cites·10 claims
- 0275US6744272B2Test circuitFiled 2002·Granted Jun 1, 2004·25 cites·11 claims
- 0364US6721904B2System for testing fast integrated digital circuits, in particular semiconductor memory modulesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 13, 2004·15 cites·29 claims
- 0461US6871306B2Method and device for reading and for checking the time position of data response signals read out from a memory module to be testedINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 22, 2005·12 cites·20 claims
- 0553US7117404B2Test circuit for testing a synchronous memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 3, 2006·8 cites·6 claims
- 0653US6618305B2Test circuit for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 9, 2003·8 cites·9 claims
- 0748US6865707B2Test data generatorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 8, 2005·6 cites·20 claims
- 0845US7062690B2System for testing fast synchronous digital circuits, particularly semiconductor memory chipsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 13, 2006·3 cites·16 claims
- 0941US6862702B2Address counter for addressing synchronous high-frequency digital circuits, in particular memory devicesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 1, 2005·3 cites·10 claims
- 1041US6839397B2Circuit configuration for generating control signals for testing high-frequency synchronous digital circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jan 4, 2005·3 cites·11 claims
- 1134US7117403B2Method and device for generating digital signal patternsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 3, 2006·0 cites·18 claims
- 1234US2003005389A1Test circuit for testing a synchronous circuitFiled 2002·Application pending·0 cites
- 1331US6957373B2Address generator for generating addresses for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 18, 2005·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →